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33874 Datasheet(PDF) 35 Page - Freescale Semiconductor, Inc |
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33874 Datasheet(HTML) 35 Page - Freescale Semiconductor, Inc |
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35 / 38 page ![]() Analog Integrated Circuit Device Data Freescale Semiconductor 35 33874 ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 2.0) Figure 11. Thermal Test Board Device on Thermal Test Board RθJA is the thermal resistance between die junction and ambient air. This device is a dual die package. Index m indicates the die that is heated. Index n refers to the number of the die where the junction temperature is sensed. A = 300sqmm 76.2 mm A = 300sqmm A = 300sqmm 76.2 mm A = 300sqmm MC33874 Pin Connections 24-Pin PQFN (12 x 12) 0.9 mm Pitch 12.0 mm x 12.0 mm Body Transparent Top View 13 24 12 10 9 8 7 6 5 4 3 2 1 11 23 22 19 20 21 16 17 18 15 14 SO GND HS3 HS1 NC HS0 HS2 GND FSI GND VPWR Material: Single layer printed circuit board FR4, 1.6mm thickness Cu traces, 0.07mm thickness Outline: 80mm x 100mm board area, including edge connector for thermal testing Area A: Cu heat-spreading areas on board surface Ambient Conditions: Natural convection, still air Table 19. Thermal Resistance Performance Thermal Resistance Area A (mm2) 1 = Power Chip, 2 = Logic Chip ( °C/W) m = 1, n = 1 m = 1, n = 2 m = 2, n = 1 m = 2, n = 2 RθJAmn 053 38 61 300 44 32 56 600 42 30 55 |
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