AD9250 datasheet(32/44 Pages) AD

32 / 44 page

AD9250

Data Sheet

Rev. 0 | Page 32 of 44

BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST

The AD9250 includes built-in test features designed to enable

verification of the integrity of each channel as well as facilitate

board level debugging. A BIST feature is included that verifies

the integrity of the digital datapath of the AD9250. Various output

test options are also provided to place predictable values on the

outputs of the AD9250.

BUILT-IN SELF-TEST

The BIST is a thorough test of the digital portion of the selected

AD9250 signal path. When enabled, the test runs from an internal

pseudo-random noise (PN) source through the digital datapath

starting at the ADC block output. The BIST sequence runs for

512 cycles and stops. The BIST signature value for Channel A

and/or Channel B is placed in Register 0x24 and Register 0x25.

The outputs are connected during this test; therefore, the PN

sequence can be observed as it runs. The PN sequence can be

continued from its last value or reset from the beginning, based

on the value programmed in Register 0x0E, Bit 2. The BIST

signature result varies based on the channel configuration.

AD9250 Datasheet(PDF) 32 Page - Analog Devices