M28F008 datasheet(18/28 Pages) INTEL

18 / 28 page

M28F008

AC INPUTOUTPUT REFERENCE WAVEFORM

271232 – 9

AC test inputs are driven at VOH (24 VTTL) for a Logic ‘‘1’’ and VOL (045 VTTL) for a Logic

‘‘0’’ Input timing begins at VIH (20 VTTL) and VIL (08 VTTL) Output timing ends at VIH and

VIL Input rise and fall times (10% to 90%) k 10 ns

AC TESTING LOAD CIRCUIT

CL e 100 pF

CL Includes Jig

271232 – 10

Capacitance

RL e 33 kX

AC CHARACTERISTICSRead-Only Operations(1 4)

Symbol

Parameter

Notes

M28F008-10(4)

M28F008-12(4)

Unit

Min

Max

Min

Max

tAVAV

tRC

Read Cycle Time

100

120

tAVQV

tACC

Address to Output Display

100

120

tELQV

tCE

CE to Output Delay

100

120

tPHQV

tPWH

RP High to Output Delay

400

tGLQV

tOE

OE to Output Delay

tELQX

tLZ

CE to Output Low Z

tEHQZ

tHZ

CE High to Output High Z

tGLQX

tOLZ

OE to Output Low Z

tGHQZ

tDF

OE High to Output High Z

tOH

Output Hold from

Addresses CE or OE

Change Whichever is First

NOTES

1 See AC InputOutput Reference Waveform for timing measurements

2 OE may be delayed up to tCE–tOE after the falling edge of CE without impact on tCE

3 Sampled not 100% tested

4 See AC InputOutput Reference Waveforms and AC Testing Load Circuits for testing characteristics

M28F008 Datasheet(PDF) 18 Page - Intel Corporation

M28F008 Datasheet(HTML) 18 Page - Intel Corporation

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28

Datasheet Download

Link URL