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DS3134 Datasheet(PDF) 180 Page - Dallas Semiconductor |
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DS3134 Datasheet(HTML) 180 Page - Dallas Semiconductor |
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180 / 203 page  DS3134 180 of 203 TAP Controller State Machine Figure 11.2A Test-Logic-Reset Upon power-up of the DS3134, the TAP controller will be in the Test-Logic-Reset state. The Instruction register will contain the IDCODE instruction. All system logic on the DS3134 will operate normally. Run-Test-Idle Run-Test-Idle is used between scan operations or during specific tests. The Instruction register and Test register will remain idle. Select-DR-Scan All test registers retain their previous state. With JTMS low, a rising edge of JTCLK moves the controller into the Capture-DR state and will initiate a scan sequence. JTMS high moves the controller to the Select-IR-SCAN state. Test-Logic-Reset Run-Test/Idle Select DR-Scan 1 0 Capture-DR 1 0 Shift-DR 0 1 Exit1-DR 1 0 Pause-DR 1 Exit2-DR 1 Update-DR 0 0 1 Select IR-Scan 1 0 Capture-IR 0 Shift-IR 0 1 Exit1-IR 1 0 Pause-IR 0 Exit2-IR 1 Update-IR 0 0 1 0 0 1 0 1 0 1 jtag_bd |
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