GC4116 datasheet(49/57 Pages) ETC

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GC4116 MULTI-STANDARD QUAD DUC CHIP

DATA SHEET REV 1.0

- 44 -

APRIL 27, 2001

This document contains preliminary information which may be changed at any time without notice

6.4

POWER CONSUMPTION

The power consumption is a function of the operating mode of the chip. The following equation estimates the typical power

supply current for the chip. Chip to chip variation is typically +/- 5%. The AC specification in Table 16 is the current tested for

during production test and represents the absolute maximum power supply current.

Where A is the number of active channels (0 to 4), N is the CIC decimation ratio, FCKis the clock rate, Nout is the number of

active output data pins, and Cout is the average capacitive load on each data pin. R is one if the resampler is active, and is 0 if

the resampler is off (RES_RESET=1 in address 5). The equation assumes random data transition density of 1 rising edge per

four clock cycles.

6.5

DC CHARACTERISTICS

Table 15: DC Operating Conditions (-40 to 85

°C case unless noted)

PARAMETER

SYMBOL

VPAD = 3.0 to 3.6V

UNITS

TEST

LEVEL

MIN

MAX

Voltage input low

VIL

0.8

Voltage input high

VIH

2.3

Voltage output low (IOL = 2mA)

VOL

0.5

Voltage output high (IOH = -2mA)

VOH

2.4

Leakage current (VIN = 0V or VPAD)

Inputs or Outputs in tristate condition

| IIN |

Pullup current (VIN = 0V) (TDI, TMS, TCK)| IPU |

Quiescent supply current, ICORE or IPAD

(VIN=0 or VIN=VPAD, Address 0 = F0, LVDS=0)

ICCQ

2mA

Data input capacitance (All inputs except CK)CIN

4 (typical)

Clock input capacitance (CK input)

CCK

13 (typical)

Notes:

Currents are measured at nominal voltages, high temperature (85C).

Voltages are measured at low speed. Output voltages are measured with the indicated current load

Test Levels:

I. Controlled by design and process and not directly tested or recommended practice.

II. Verified on initial part evaluation.

III. 100% tested at room temperature, sample tested at hot and cold.

IV. 100% tested at hot, sample tested cold.

V. 100% tested at hot and cold.

IPAD (TYP)

VPAD

()

FCK

--------



 N

out

() Cout

()

ICORE (TYP)

VCORE

2.5

-------------



 FCK

100M

--------------





A 30

450

---------





15R

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