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SC2200 Datasheet(PDF) 382 Page - National Semiconductor (TI) |
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SC2200 Datasheet(HTML) 382 Page - National Semiconductor (TI) |
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382 / 433 page ![]() www.national.com 382 Revision 3.0 Electrical Specifications (Continued) Figure 8-15. Load Circuits for Maximum Time Measurements 8.3.5.1 Measurement and Test Conditions Table 8-20. Measurement Condition Parameters Symbol Value Unit VTH 1 1. The input test is performed with 0.1 VIO of overdrive. Timing parameters must not exceed this overdrive. 0.6 VIO V VTL 1 0.2 VIO V VTEST 0.4 VIO V VSTEP (Rising Edge) 0.285 VIO V VSTEP (Falling Edge) 0.615 VIO V VMAX 2 2. VMAX specifies the maximum peak-to-peak waveform allowed for measuring input timing. 0.4 VIO V Input Signal Edge Rate 1 V/ns Output Buffer Output Buffer VCC 25 Ω 25 Ω 10 pF 10 pF 0.5" max. 0.5" max. Pin tVAL (Max) Rising Edge tVAL (Max) Falling Edge |
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