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AD9218

Rev. C | Page 8 of 28

ABSOLUTE MAXIMUM RATINGS

EXPLANATION OF TEST LEVELS

Table 5.

Parameter

Rating

100% production tested.

VD, V

4 V

II.

100% production tested at 25°C and sample tested at

specified temperatures.

Analog Inputs

–0.5 V to VD + 0.5 V

Digital Inputs

–0.5 V to V

+ 0.5 V

REFIN Inputs

–0.5 V to VD + 0.5 V

III.

Sample tested only.

Digital Output Current

20 mA

IV.

Parameter is guaranteed by design and characterization

testing.

Operating Temperature

–55°C to +125°C

Storage Temperature

–65°C to +150°C

Maximum Junction Temperature

150°C

Parameter is a typical value only.

Maximum Case Temperature

150°C

θA (measured on a 4-layer board with

solid ground plane)

57°C/W

VI.

100% production tested at 25°C; guaranteed by design

and characterization testing for industrial temperature

range.

100% production tested at temperature extremes for

military devices.

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

Table 6. User Select Modes

Power-Down and Data Alignment Settings

Power down both Channel A and Channel B.

Power down Channel B only.

Normal operation (data align disabled).

Data align enabled (data from both channels

available on rising edge of Clock A. Channel B data is

delayed by a ½ clock cycle.)

ESD CAUTION

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