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LTC2602 Datasheet(PDF) 20 Page - Linear Technology

Part # LTC2602
Description  Dual, 16-Bit, 5Msps Differential Input ADC with Wide Input Common Mode Range
PDF  26 Pages
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Manufacturer  LINER [Linear Technology]
Direct Link  http://www.linear.com
Logo LINER - Linear Technology

LTC2602 Datasheet(HTML) 20 Page - Linear Technology

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LTC2323-16
20
232316fc
For more information www.linear.com/LTC2323-16
APPLICATIONS INFORMATION
TIMING AND CONTROL
CNV Timing
A rising edge on CNV initiates the acquisition phase and
puts the internal sample-and-hold into the sample mode.
A falling edge on CNV puts the internal sample-and-hold
into the hold mode and starts a conversion cycle. The
CNV pulse must be at least 25ns wide for proper opera-
tion. CNV must be driven by a fast low jitter signal with a
fall time from OVDD to below 100mV of less than 1ns. To
achieve this fast falling edge, the distance from the CNV
source to the CNV pin should be minimized. The trace
for this pulse should be kept as narrow as possible and
routed away from adjacent traces or planes to minimize
capacitance. The drive strength of the gate driving the
CNV line must be sufficient to yield a fast falling edge at
the ADC pin to below 100mV. We recommend the applica-
tions circuit on page 26, which uses a high speed flip-flop
to generate the CNV pulse to the ADC, eliminating the
effect of jitter from the FPGA. If jitter from the FPGA is
not a concern, the flip-flop can be eliminated and replaced
with an inverter such as the NC7SZ04P5X
SCK Serial Data Clock Input
The falling edge of this clock shifts the conversion
result MSB first onto the SDO pins. A 105MHz external
clock must be applied at the SCK pin to achieve 5Msps
throughput.
CLKOUT Serial Data Clock Output
The CLKOUT output provides a skew-matched clock to
latch the SDO output at the receiver. The timing skew
of the CLKOUT and SDO outputs are matched. For high
throughput applications, using CLKOUT instead of SCK to
capture the SDO output eases timing requirements at the
receiver. For low throughput speed applications, CLKOUT+
can be disabled by tying CLKOUTto OVDD.
Nap/Sleep Modes
Nap mode is a method to save power without sacrificing
power-up delays for subsequent conversions. Sleep mode
has substantial power savings, but a power-up delay is
incurred to allow the reference and power systems to
become valid. To enter nap mode on the LTC2323-16,
the SCK signal must be held high or low and a series
of two CNV pulses must be applied. This is the case for
both CMOS and LVDS modes. The second rising edge of
CNV initiates the nap state. The nap state will persist until
either a single rising edge of SCK is applied, or further
CNV pulses are applied. The SCK rising edge will put the
LTC2323-16 back into the operational (full-power) state.
When in nap mode, two additional pulses will put the
LTC2323-16 in sleep mode. When configured for CMOS
I/O operation, a single rising edge of SCK can return the
LTC2323-16 into operational mode. A 10ms delay is nec-
essary after exiting sleep mode to allow the reference buf-
fer to recharge the external filter capacitor. In LVDS mode,
exit sleep mode by supplying a fifth CNV pulse. The fifth
pulse will return the LTC2323-16 to operational mode,
and further SCK pulses will keep the part from re-entering
nap and sleep modes. The fifth SCK pulse also works in
CMOS mode as a method to exit sleep. In the absence of
SCK pulses, repetitive CNV pulses will cycle the LTC2323-
16 between operational, nap and sleep modes indefinitely.
RefertothetimingdiagramsinFigure 18,Figure 19,Figure 20
and Figure 21 for more detailed timing information about
sleep and nap modes.
FULL POWER MODE
1
2
CNV
SCK
HOLD STATIC HIGH OR LOW
NAP MODE
SDO1
SDO2
WAKE ON 1ST SCK EDGE
Z
Z
232316 F18
Figure 18. CMOS and LVDS Mode NAP and WAKE Using SCK



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