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ADS5242IPAP Datasheet(PDF) 25 Page - Texas Instruments |
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ADS5242IPAP Datasheet(HTML) 25 Page - Texas Instruments |
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25 / 29 page ![]() www.ti.com ADS5242 SBAS330C – OCTOBER 2004 – REVISED OCTOBER 2005 Changes from A Revision (September 2005) to B Revision .......................................................................................... Page • Changed unit values for references of fourth bullet in Features section. .............................................................................. 1 • Changed Synch to Bit in tenth bullet of Features section...................................................................................................... 1 • Deleted parallel in first paragraph of Description section. ..................................................................................................... 1 • Changed unit value of ninth row in Absolute Maximum Ratings table. ................................................................................. 2 • Changed W to Ω in second footnote of Absolute Maximum Ratings table............................................................................ 2 • Changed Assured to Tested in first row of DC Accuracy section in Electrical Characteristics table. ................................... 4 • Changed unit values for typical column in Power Requirements section of Electrical Characteristics table. ....................... 4 • Changed 512 to 2048 in first footnote of Electrical Characteristics table.............................................................................. 5 • Changed 1024LSB to 4096LSB in second footnote of Electrical Characteristics table......................................................... 5 • Changed Typ conditions column of AC Characteristics table................................................................................................ 6 • Deleted condition value for C O row of LVDS table. ............................................................................................................... 7 • Changed 10 to 12 in second footnote of Test Patterns table. ............................................................................................. 10 • Changed Figure 30. ............................................................................................................................................................. 18 • Deleted heavily from first sentence of first paragraph of Reference Circuit Design section in Theory of Operation. ......... 22 • Changed Figure 3. ............................................................................................................................................................... 22 • Changed eight to four , ±2.0 to ±20, and added (±3σ) in seventh sentence of first paragraph of Clocking section in Theory of Operation. ............................................................................................................................................................ 22 Changes from B Revision (September 2005) to C Revision .......................................................................................... Page • Added first footnote to Test Patterns table. ......................................................................................................................... 10 • Changed 1Ω to 2Ω in REF B and REFT rows of Pin Descriptions table. .............................................................................. 12 25 |
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