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SC18IM704 Datasheet(PDF) 14 Page - NXP Semiconductors |
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SC18IM704 Datasheet(HTML) 14 Page - NXP Semiconductors |
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14 / 28 page ![]() NXP Semiconductors SC18IM704 UART to I2C-bus bridge VDD = 1.71 V to 3.6 V; Tamb = -40 °C to +105 °C; unless otherwise specified. Symbol Parameter Conditions Min Typ[1] Max Unit Vth(LH) positive-going threshold voltage except SCL, SDA - 0.6VDD 0.7VDD V VIH HIGH-level input voltage SCL, SDA only [2] 0.7VDD - 5.4 V IOL = 4 mA; 2.5 V ≤ VDD ≤ 3.6 V - 0.5 V VOL LOW-level output voltage IOL = 3 mA; 1.71 V ≤ VDD ≤ 2.5 V - 0.5 V IOH = 4 mA; 2.5 V ≤ VDD ≤ 3.6 V VDD - 0.4 - - V VOH HIGH-level output voltage IOH = 3 mA; 1.71 V ≤ VDD ≤ 2.5 V VDD - 0.5 - V Cio input/output capacitance [3] - - 15 pF IIL LOW-level input current logic 0; all ports; VI = 0.4 V - - -80 μA ILI input leakage current all ports; VI = VIL or VIH [4] - - -10 μA IT(HL) negative-going transition current logic 1-to-0; all ports; VI = 2.0 V at VDD = 3.6 V -30 - -450 μA VI = 0 V; [5] µA 2.0 V ≤ VDD ≤ 3.6 V 10 50 90 µA 1.71 V ≤ VDD ≤ 2.0 V 7 50 85 µA Ipu pull-up current VDD < VI < 5 V 0 0 0 µA Table 12. Static characteristics...continued [1] Typical ratings are not guaranteed. The values listed are at room temperature, 3 V. [2] VDD ≥ to 1.71V; otherwise limited to 3.6 V max when VDD = 0 V [3] Pin capacitance is characterized but not tested. [4] Measured with pins in high-impedance mode. [5] Pull-up current measured across the weak pull-up resistor 12 Dynamic characteristics All the timing limits are valid within the operating supply voltage and ambient temperature range; VDD = 1.71 V to 3.6 V; Tamb = -40 °C to +105 °C; and refer to VIL and VIH with an input voltage of VSS to VDD. Standard mode I2C-bus Fast mode I2C-bus Symbol Parameter Conditions Min Max Min Max Unit fSCL SCL clock frequency 0 100 0 400 kHz tBUF bus free time between a STOP and START condition 4.7 - 1.3 - μs tHD;STA hold time (repeated) START condition 4.0 - 0.6 - μs tSU;STA set-up time for a repeated START condition 4.7 - 0.6 - μs tSU;STO set-up time for STOP condition 4.0 - 0.6 - μs tHD;DAT data hold time 0 - 0 - ns tVD;ACK data valid acknowledge time - 0.6 - 0.6 μs LOW-level - 0.6 - 0.6 μs tVD;DAT data valid time HIGH-level - 0.6 - 0.6 μs Table 13. I2C-bus timing characteristics SC18IM704 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 1.0 — 22 September 2021 14 / 28 |
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