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AD9259 Datasheet(PDF) 25 Page - Analog Devices |
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AD9259 Datasheet(HTML) 25 Page - Analog Devices |
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25 / 52 page ![]() AD9259 Rev. 0 | Page 25 of 52 When using the serial port interface (SPI), the DCO phase can be adjusted in 60° increments relative to the data edge. This enables the user to refine system timing margins if required. The default DCO timing, as shown in Figure 2, is 90° relative to the output data edge. An 8-, 10-, and 12-bit serial stream can also be initiated from the SPI. This allows the user to implement and test compatibility to lower resolution systems. When changing the resolution to an 8-, 10-, or 12-bit serial stream, the data stream is shortened. See Figure 3 for a 12-bit example. When using the SPI, all of the data outputs can also be inverted from their nominal state. This is not to be confused with inverting the serial stream to an LSB-first mode. In default mode, as shown in Figure 2, the MSB is represented first in the data output serial stream. However, this can be inverted so that the LSB is represented first in the data output serial stream (see Figure 4). There are 12 digital output test pattern options available that can be initiated through the SPI. This is a useful feature when validating receiver capture and timing. Refer to Table 9 for the output bit sequencing options available. Some test patterns have two serial sequential words and can be alternated in various ways, depending on the test pattern chosen. It should be noted that some patterns may not adhere to the data format select option. In addition, customer user patterns can be assigned in the 0x19, 0x1A, 0x1B, and 0x1C register addresses. All test mode options can support 8- to 14-bit word lengths in order to verify data capture to the receiver. Please consult the Memory Map section for information on how to change these additional digital output timing features through the serial port interface or SPI. SDIO/ODM Pin This pin is for applications that do not require SPI mode operation. The SDIO/ODM pin can enable a low power, reduced signal option similar to the IEEE 1596.3 reduced range link output standard if this pin and the CSB pin are tied to AVDD during device power- up. This option should only be used when the digital output trace lengths are less than 2 inches in length to the LVDS receiver. The FCO, DCO, and outputs function normally, but the LVDS signal swing of all channels is reduced from 350 mV p-p to 200 mV p-p. This output mode allows the user to further lower the power on the DRVDD supply. For applications where this pin is not used, it should be tied low. In this case, the device pin can be left open, and the 30 kΩ internal pull-down resistor pulls this pin low. This pin is only 1.8 V tolerant. If applications require this pin to be driven from a 3.3 V logic level, insert a 1 kΩ resistor in series with this pin to limit the current. Table 10. Output Driver Mode Pin Settings Selected ODM ODM Voltage Resulting Output Standard Resulting FCO and DCO Normal operation 10 kΩ to AGND ANSI-644 (default) ANSI-644 (default) ODM AVDD Low power, reduced signal option Low power, reduced signal option SCLK/DTP Pin This pin is for applications that do not require SPI mode operation. The serial clock/digital test pattern (SCLK/DTP) pin can enable a single digital test pattern if this pin and the CSB pin are held high during device power-up. When the DTP is tied to AVDD, all the ADC channel outputs shift out the following pattern: 10 0000 0000 0000. The FCO and DCO outputs still work as usual while all channels shift out the repeatable test pattern. This pattern allows the user to perform timing alignment adjustments among the FCO, DCO, and output data. For normal operation, this pin should be tied to AGND through a 10 kΩ resistor. This pin is both 1.8 V and 3.3 V tolerant. Table 11. Digital Test Pattern Pin Settings Selected DTP DTP Voltage Resulting D+ and D− Resulting FCO and DCO Normal operation 10 kΩ to AGND Normal operation Normal operation DTP AVDD 10 0000 0000 0000 Normal operation Additional and custom test patterns can also be observed when commanded from the SPI port. Consult the Memory Map section to choose from the different options available. CSB Pin The chip select bar (CSB) pin should be tied to AVDD for applications that do not require SPI mode operation. By tying CSB high, all SCLK and SDIO information is ignored. This pin is both 1.8 V and 3.3 V tolerant. RBIAS Pin To set the internal core bias current of the ADC, place a resistor (nominally equal to 10.0 kΩ) to ground at the RBIAS pin. The resistor current is derived on-chip and sets the ADC’s AVDD current to a nominal 185 mA at 50 MSPS. Therefore, it is imperative that at least a 1% tolerance on this resistor be used to achieve consistent performance. If SFDR performance is not as critical as power, simply adjust the ADC core current to achieve a lower power. Figure 53 and Figure 54 show the relationship between the dynamic range and power as the RBIAS resistance is changed. Nominally, a 10.0 kΩ value is used, as indicated by the dashed line. |
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