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S29PL-J55BAI011 Datasheet(PDF) 75 Page - SPANSION |
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S29PL-J55BAI011 Datasheet(HTML) 75 Page - SPANSION |
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75 / 96 page ![]() September 22, 2006 S29PL-J_00_A9 S29PL-J 73 Da ta Sh e e t (Adv a n ce In f o r m ation) Figure 20.2 Input Waveforms and Measurement Levels 20.3 VCC Ramp Rate All DC characteristics are specified for a VCC ramp rate > 1V/100 µs and VCC ≥ VCCQ - 100 mV. If the VCC ramp rate is < 1V/100 µs, a hardware reset required.+ 20.4 Read Operations Notes 1. Not 100% tested. 2. See Figure 20.1 on page 72 and Table 20.1 on page 72 for test specifications 3. Measurements performed by placing a 50 ohm termination on the data pin with a bias of VCC /2. The time from OE# high to the data bus driven to VCC /2 is taken as tDF. 4. S29PL129J has two CE# (CE1#, CE2#). 5. Valid CE1# / CE2# conditions: (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL) or (CE1# = VIH, CE2# = VIH) 6. Valid CE1# / CE2# transitions: (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL) to (CE1# = CE2# = VIH) 7. Valid CE1# / CE2# transitions: (CE1# = CE2# = VIH) to (CE1# = VIL,CE2# = VIH) or (CE1# = VIH,CE2# = VIL) 8. For 70 pF Output Load Capacitance, 2 ns will be added to the above tACC,tCE,tPACC,tOE values for all speed grades VIO 0.0 V VIO/2 VIO/2 Output Measurement Level Input Table 20.3 Read-Only Operations Parameter Description (Notes) Test Setup Speed Options Unit JEDEC Std. 55 60 65 70 tAVAV tRC Read Cycle Time (1) Min 55 606570 ns tAVQV tACC Address to Output Delay CE#, OE# = VIL Max 55 606570 ns tELQV tCE Chip Enable to Output Delay OE# = VIL Max 55 606570 ns tPACC Page Access Time Max 20 25 25 30 ns tGLQV tOE Output Enable to Output Delay Max 20 25 30 ns tEHQZ tDF Chip Enable to Output High Z (3) Max 16 ns tGHQZ tDF Output Enable to Output High Z (1, 3) Max 16 ns tAXQX tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (3) Min 5 ns tOEH Output Enable Hold Time (1) Read Min 0 ns Toggle and Data# Polling Min 10 ns |
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