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56F8366 Datasheet(PDF) 166 Page - Freescale Semiconductor, Inc |
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56F8366 Datasheet(HTML) 166 Page - Freescale Semiconductor, Inc |
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166 / 184 page ![]() 56F8366 Technical Data, Rev. 6 166 Freescale Semiconductor Preliminary ADC reference circuit power-up time4 tVREF —— 25 ms Conversion time tADC —6 — tAIC cycles3 Sample time tADS —1 — tAIC cycles3 Input capacitance CADI —5 — pF Input injection current5, per pin IADI —— 3 mA Input injection current, total IADIT —— 20 mA VREFH current IVREFH —1.2 3 mA ADC A current IADCA —25 — mA ADC B current IADCB —25 — mA Quiescent current IADCQ —0 10 μA Uncalibrated Gain Error (ideal = 1) EGAIN — +/- .004 +/- .01 — Uncalibrated Offset Voltage VOFFSET — +/- 27 +/- 40 mV Calibrated Absolute Error6 AECAL —See Figure 10-22 — LSBs Calibration Factor 17 CF1 — 0.002289 — — Calibration Factor 2 CF2 — -25.6 — — Crosstalk between channels — — -60 — dB Common Mode Voltage Vcommon —(VREFH - VREFLO) / 2 — V Signal-to-noise ratio SNR — 64.6 — db Signal-to-noise plus distortion ratio SINAD — 59.1 — db Total Harmonic Distortion THD — 60.6 — db Spurious Free Dynamic Range SFDR — 61.1 — db Effective Number Of Bits8 ENOB — 9.6 — Bits 1. INL measured from Vin = .1VREFH to Vin = .9VREFH 10% to 90% Input Signal Range 2. LSB = Least Significant Bit 3. ADC clock cycles 4. Assumes each voltage reference pin is bypassed with 0.1 μF ceramic capacitors to ground 5. The current that can be injected or sourced from an unselected ADC signal input without impacting the performance of the ADC. This allows the ADC to operate in noisy industrial environments where inductive flyback is possible. 6. Absolute error includes the effects of both gain error and offset error. 7. Please see the 56F8300Peripheral User’s Manual for additional information on ADC calibration. 8. ENOB = (SINAD - 1.76)/6.02 Table 10-24 ADC Parameters (Continued) Characteristic Symbol Min Typ Max Unit |
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