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RE46C191 Datasheet(PDF) 28 Page - Microchip Technology |
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RE46C191 Datasheet(HTML) 28 Page - Microchip Technology |
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28 / 44 page ![]() RE46C191 DS20005225H-page 28 2013-2023 Microchip Technology Inc. and its subsidiaries 5.1.3 LOW BATTERY CHECK CURRENT The low battery check current is the current required for the low battery test. It includes both the loaded (RLED on) and unloaded (RLED off) tests. The boost component of the loaded test represents the cost of charging the boost capacitor to the higher voltage level. This has a fixed cost for every loaded check because the capacitor is gradually discharged during subsequent operations and the energy is generally not recovered. The other calculations are similar to those shown in Equation 5-1. The unloaded test has a minimal contribution because it involves only some internal reference and comparator circuitry. 5.1.4 BATTERY LIFE When estimating the battery life, several additional factors must be considered. These include battery resistance, battery self-discharge rate, capacitor leakages and the effect of the operating temperature on all of these characteristics. Some number of false alarms and user tests must also be included in any calculation. For 10-year applications, a 3V spiral wound lithium manganese dioxide battery with a laser seal is recom- mended. These can be found with capacities of 1400 to 1600 mAh. 5.1.5 FUNCTIONAL TIMING DIAGRAMS FIGURE 5-1: RE46C191 Timing Diagram – Standby, No Alarm, Low Supply Test Failure and Chamber Test Failure. Standby, No Alarm (not to Scale) TIRON TPER0 IRED Chamber Test (Internal Signal) TPCT1 Low Battery Test (Internal signal) TPLB2 TON1 RLED TPLB1 LTD Sample TLTD EOL TEOL Low Supply Test Failure Low Battery Test (Internal signal) RLED THON1 HORN THPER1 Chamber Test Failure Chamber Test (Internal Signal) THON2 HORN THOF2 THPER2 |
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