4155C datasheet(11/14 Pages) HP

11 / 14 page

Introduction

Agilent Desktop EasyEXPERT software

makes every user a parametric test

expert. The Microsoft® Windows®-based

interface is familiar, even to new engi-

neers who have limited experience using

parametric measurement instruments.

Its unique task-based approach enables

the user to focus on the real task-at-hand

(device characterization) without having

to be a specialist at using the instrument

hardware. Desktop EasyEXPERT supports

all aspects of parametric test, from basic

manual measurements to test automa-

tion across a wafer in conjunction with a

semiautomatic wafer prober.

Features and beneﬁts

Large application test library

Desktop EasyEXPERT comes with more

than 230 application tests conveniently

organized by device type, application, and

technology. Many of these application

tests will run on the 4155 and 4156 without

modiﬁcation. You also can easily edit and

customize the furnished application tests

to ﬁt your speciﬁc needs.

Ofﬂine capability

Desktop EasyEXPERT can run in either

online or ofﬂine mode. In ofﬂine mode you

can perform tasks such as analyzing data

and creating new application tests. This

frees up your existing analyzer from being

needed for development work and enables

you to use it for its primary purpose:

making measurements.

GUI-based classic test mode

Desktop EasyEXPERT offers a classic

test mode that maintains the look, feel,

and terminology of the 4155/4156 user

interface. In addition, it improves the

4155/4156 user interface by taking full

advantage of the Windows GUI features.

Easy test sequencing

A GUI-based Quick Test mode lets you to

perform test sequencing without program-

ming. You can select, copy, rearrange and

cut-and-paste any application tests with a

few simple mouse clicks. Once you have

selected and arranged your tests, simply

click on the measurement button to begin

running an automated test sequence.

Prober control

All popular semiautomatic wafer probers

are supported by Desktop EasyEXPERT.

You can deﬁne wafer, die and module

information for probing across an entire

wafer. You can also combine wafer prober

control with either Quick Test mode or an

application test-based test sequence to

perform multiple testing on various devices

across the wafer.

Automatic data export

Desktop EasyEXPERT has the ability to

automatically export measurement data in

real time, in a variety of formats. You can

save data to any drive connected to the

PC. If you wish, you can export data to a

network drive and view test results on your

desktop PC at the same time your instru-

ments are performing testing in the lab.

Software Functions

Operation mode

Application test mode, Classic test mode,

Quick test mode

Key Functions

• Categorized and predeﬁned application

library

• Device deﬁnition

• Measurement parameter settings

• Save/Recall My Favorite Setups

• Deﬁne/customize application library

• Execute measurement (Single/Repeat/

Append)

• Quick test execution

• Save/Recall measurement data and

settings

• Test result data management

• Import/Export device deﬁnition, measure-

ment settings, my favorite setup,

measurement data, and application

library

• Graph plot display/analysis/printing

• Switching matrix control

• Workspace management

Application Library

Category:

Sample test deﬁnitions for the following

applications. They are subject to change

without notice.

Structure, CMOS, Bipolar (BJT), TFT,

Discrete, Nanotechnology, Utility

Supported 4155/4156

Functionality

Desktop EasyEXPERT Standard

edition

• Staircase Sweep

Desktop EasyEXPERT Plus edition

The following additional functions

are supported.

• I/V-t Sampling except Thinned-out and

Logarithmic modes

• VSU/VMU except differential voltage

measurement using VMU

• PGU (41501B)

Each SMU can sweep using VAR1 (primary

sweep), VAR2 (secondary sweep), or

VAR1' (synchronous sweep).

Staircase Sweep Measurement Mode

Forces swept voltage or current, and

measures DC voltage or current. A second

channel can be programmed to output

a pulsed bias voltage or current. A third

channel can be synchronized with the

primary sweep channel as an additional

voltage or current sweep source.

Number of Steps for VAR1 and VAR1': 1

to 1001

Number of Steps for VAR2: 1 to 128

Sweep type: Linear or logarithmic

Sweep direction: Single or double sweep

Hold Time: 0 to 655.35 s, 10 ms resolution

Delay Time: 0 to 65.5350 s, 100 μs

resolution

Pulsed Sweep Measurement Mode

This mode forces pulsed swept voltage

or current, and measures DC voltage

or current. A second channel can be

programmed to output a staircase sweep

voltage or current synchronized with the

pulsed sweep output.

Agilent Desktop EasyEXPERT Software

4155C Datasheet(PDF) 11 Page - Agilent(Hewlett-Packard)

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