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LPC2109 Datasheet(PDF) 29 Page - NXP Semiconductors |
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LPC2109 Datasheet(HTML) 29 Page - NXP Semiconductors |
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29 / 46 page ![]() LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved. Product data sheet Rev. 7 — 14 June 2011 29 of 46 NXP Semiconductors LPC2109/2119/2129 Single-chip 16/32-bit microcontrollers [1] Conditions: VSSA =0V, VDDA =3.3 V. [2] The ADC is monotonic, there are no missing codes. [3] The differential linearity error (ED) is the difference between the actual step width and the ideal step width. See Figure 4. [4] The integral non-linearity (EL(adj)) is the peak difference between the center of the steps of the actual and the ideal transfer curve after appropriate adjustment of gain and offset errors. See Figure 4. [5] The offset error (EO) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the ideal curve. See Figure 4. [6] The gain error (EG) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset error, and the straight line which fits the ideal transfer curve. See Figure 4. [7] The absolute voltage error (ET) is the maximum difference between the center of the steps of the actual transfer curve of the non-calibrated ADC and the ideal transfer curve. See Figure 4. Table 7. ADC static characteristics VDDA = 2.5 V to 3.6 V unless otherwise specified; Tamb = 40 C to +85 C unless otherwise specified. ADC frequency 4.5 MHz. Symbol Parameter Conditions Min Typ Max Unit VIA analog input voltage 0 - VDDA V Cia analog input capacitance -- 1 pF ED differential linearity error [1][2][3] -- 1LSB EL(adj) integral non-linearity [1][4] -- 2LSB EO offset error [1][5] -- 3LSB EG gain error [1][6] -- 0.5 % ET absolute error [1][7] -- 4LSB |
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