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TLC320AD55CDW Datasheet(PDF) 7 Page - Texas Instruments

Part # TLC320AD55CDW
Description  Sigma-Delta Analog Interface Circuit
PDF  41 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

TLC320AD55CDW Datasheet(HTML) 7 Page - Texas Instruments

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1–1
1 Introduction
The TLC320AD55C provides high resolution low-speed signal conversion from digital-to-analog (D/A) and
from analog-to-digital (A /D) using oversampling sigma-delta technology. This device consists of two, serial,
synchronous conversion paths (one for each data direction) and includes an interpolation filter before the
digital-to-analog converter (DAC) and a decimation filter after the analog-to-digital converter (ADC) (see
Figure 1–1). Other overhead functions provide analog filtering and on-chip timing and control. The
sigma-delta architecture produces high resolution, analog-to-digital and digital-to-analog conversion at low
system speeds and low cost.
The options and the circuit configurations of this device can be programmed through the serial interface.
The options include reset, power-down, communications protocol, serial clock rate, signal sampling rate,
and test mode as outlined in Appendix A. The circuit configurations could include a selection of input ports
to the ADC, analog loopback, digital loopback, decimator sinc filter output, decimator finite-duration
impulse-response (FIR) filter output, interpolator sinc filter output, and interpolator FIR filter output. The
TLC320AD55C is characterized for operation from 0
°C to 70°C.
1.1
Features
•
Single 5-V power supply
•
Power dissipation (PD) of 150 mW maximum in the operating mode
•
Power-down mode to 1 mW
•
General-purpose 16-bit signal processing
•
2s-complement format
•
Serial port interface
•
Minimum 80-dB harmonic distortion plus noise
•
Differential architecture
•
Internal reference voltage (Vref)
•
Internal 64
× oversampling
•
Analog output with programmable gain of 1, 1/2, 1/4, and 0 (squelch)
•
Phone-mode output control
•
Variable conversion rate selected as MCLK/(Fk
× 256), Fk = 1,2,3,...,256
•
System test mode:
–
Digital loopback test
–
Analog loopback test



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