22

Requirement

Test method

Inspection

paragraph of

paragraph of

Sampling procedure

MIL-PRF-49470

MIL-PRF-49470

Subgroup 1

Thermal shock and voltage conditioning 1/

3.9

4.8.5

100% inspection

Subgroup 2

Visual and mechanical examination:

Material

3.4

4.8.4

Physical dimensions

3.1

13 samples

Interface requirements

3.5 and 3.5.1

0 failures

(other than physical dimensions)

Marking 2/3.28

Workmanship

3.30

SMPS Stacked MLC Capacitors

(SM Style) DSCC #87106 and #88011

Table II. Group A inspection.

1/ Post checks are required (see paragraph 3.9 of MIL-PRF-49470).

2/ Marking defects are based on visual examination only. Any subsequent electrical defects shall not

be used as a basis for determining marking defects.

Requirement

Test method

Number of

Number of

Inspection

paragraph of

paragraph of

sample units

defectives

MIL-PRF-49470

MIL-PRF-49470

to be inspected

permitted 2/

Subgroup 1 3/

Temperature coefficient

4/

4/

Resistance to solvents 5/ 6/

3.23

4.8.20

Immersion

3.18

4.8.15

12

1

Terminal strength 5/

3.24

4.8.10

Subgroup 2

Resistance to soldering heat

3.20

4.8.17

12

1

6/ 1

Moisture resistance

3.21

4.8.18

Subgroup 3

Marking legibility

3.28.1

4.8.4.1

6

1

(laser marking only)

Subgroup 4

Solderability

3.15

4.8.12

3

0

Subgroup 5

Life

3.26

4.8.22

5 minimum

0

per case code

1/ Unless otherwise specified herein, when necessary, mounting of group B samples shall be at the

discretion of the manufacturer.

2/ A sample unit having one or more defects shall be charged as a single defective.

3/ Order of tests is at discretion of manufacturer.

4/ See 3.2.3 of DSCC 87106.

5/ Sample size shall be 3 pieces with zero defectives permitted.

6/ Total of one defect allowed for combination of subgroup 1, subgroup 2, and subgroup 3 inspections.

Table III. Group B inspection. 1/