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MAX1192 Datasheet(PDF) 25 Page - Maxim Integrated Products |
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MAX1192 Datasheet(HTML) 25 Page - Maxim Integrated Products |
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25 / 28 page ![]() Ultra-Low-Power, 22Msps, Dual 8-Bit ADC ______________________________________________________________________________________ 25 Static Parameter Definitions Integral Nonlinearity (INL) Integral nonlinearity is the deviation of the values on an actual transfer function from a straight line. This straight line can be either a best-straight-line fit or a line drawn between the end points of the transfer function, once offset and gain errors have been nullified. The static lin- earity parameters for the MAX1192 are measured using the end-point method. Differential Nonlinearity (DNL) Differential nonlinearity is the difference between an actual step width and the ideal value of 1LSB. A DNL error specification of less than 1LSB guarantees no missing codes and a monotonic transfer function. Offset Error Ideally, the midscale MAX1192 transition occurs at 0.5 LSB above midscale. The offset error is the amount of deviation between the measured transition point and the ideal transition point. Gain Error Ideally, the full-scale MAX1192 transition occurs at 1.5 LSB below full-scale. The gain error is the amount of deviation between the measured transition point and the ideal transition point with the offset error removed. Dynamic Parameter Definitions Aperture Jitter Figure 13 depicts the aperture jitter (tAJ), which is the sample-to-sample variation in the aperture delay. Aperture Delay Aperture delay (tAD) is the time defined between the rising edge of the sampling clock and the instant when an actual sample is taken (Figure 13). Signal-to-Noise Ratio (SNR) For a waveform perfectly reconstructed from digital samples, the theoretical maximum SNR is the ratio of the full-scale analog input (RMS value) to the RMS quantization error (residual error). The ideal, theoretical minimum analog-to-digital noise is caused by quantiza- tion error only and results directly from the ADC’s reso- lution (N bits): SNRdB[max] = 6.02 × N + 1.76 In reality, there are other noise sources besides quanti- zation noise: thermal noise, reference noise, clock jitter, etc. SNR is computed by taking the ratio of the RMS signal to the RMS noise. RMS noise includes all spec- tral components to the Nyquist frequency excluding the fundamental, the first five harmonics, and the DC offset. Signal-to-Noise Plus Distortion (SINAD) SINAD is computed by taking the ratio of the RMS sig- nal to the RMS noise. RMS noise includes all spectral components to the Nyquist frequency excluding the the fundamental and the DC offset. Effective Number of Bits (ENOB) ENOB specifies the dynamic performance of an ADC at a specific input frequency and sampling rate. An ideal ADC’s error consists of quantization noise only. ENOB for a full-scale sinusoidal input waveform is computed from: ENOB SINAD . . = -1 76 602 HOLD ANALOG INPUT SAMPLED DATA (T/H) T/H tAD tAJ TRACK TRACK CLK Figure 13. T/H Aperture Timing |
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