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LM9800 Datasheet(PDF) 6 Page - National Semiconductor (TI) |
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LM9800 Datasheet(HTML) 6 Page - National Semiconductor (TI) |
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6 / 34 page ![]() AC Electrical Characteristics, MCLK Dependent The following specifications apply for AGND = DGND = DGND (I/O) = 0V, VA = VD = VD(I/O) = +5.0 VDC, REF IN = +1.225 V DC,fMCLK = 20MHz, tMCLK = 1/fMCLK,tr = tf = 5ns, Rs = 25Ω,CL (databus loading) = 50 pF/pin. Refer to Table 2 : Configu- ration Register Parameters for limits labelled C.R. Boldface limits apply for T A = TJ = TMIN to TMAX; all other limits TA = T J = 25˚C. Symbol Parameter Conditions Typical Limits Units (Note 9) (Note 10) (Limits) t START MCLK to first φ1 high 50ns 1 t MCLK tφ φ1, φ2 Clock Period Standard CCD Mode 400ns 8 t MCLK Even/Odd CCD Mode 800ns 16 t MCLK t TRWIDTH Transfer Pulse (TR) Width C.R. µs t GUARD φ1 to TR, TR to φ1 Guardband C.R. ns t RSWIDTH Reset Pulse (RS) Width C.R. ns t RS Falling Edge of φ1 to RS Standard CCD Mode C.R. ns Either Edge of φ1 to RS Even/Odd CCD Mode t S/HREF Falling Edge of φ1 to Ref. Sample Standard CCD Mode C.R. ns Either Edge of φ1 to Ref. Sample Even/Odd CCD Mode t S/HSIG Falling Edge of φ1 to Sig. Sample Standard CCD Mode C.R. ns Either Edge of φ1 to Sig. Sample Even/Odd CCD Mode t S/HWIDTH Sample Pulse Width 50ns 1 t MCLK (Acquisition Time) t SYNCLOW SYNC Low Between Lines 100ns 2 t MCLK (min) t B SYNC Setup of φ1 to end line 2 t MCLK (max) t CCLKWIDTH CCLK Pulse Width 250ns 5 t MCLK t DATAVALID Data Valid Time from EOC Low 300 ns (min) t EOCWIDTH EOC Pulse Width 250ns 5 t MCLK φ1 and φ2 Frequency Standard CCD Mode 2.5MHz f MCLK/8 Hz Even/Odd CCD Mode 1.25MHz f MCLK/16 Hz φ1 and φ2 Duty Cycle 50 % Electrical Characteristics (Notes) Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test condi- tions. Note 2: All voltages are measured with respect to GND = AGND = DGND = DGND(I/O) = 0V, unless otherwise specified. Note 3: When the input voltage (VIN) at any pin exceeds the power supplies (VIN < GND or VIN >VA or VD), the current at that pin should be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can simultaneously safely exceed the power supplies with an input current of 25 mA to two. Note 4: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax, θJA and the ambient temperature, TA. The maximum allowable power dissipation at any temperature is PD = (TJmax–TA)/θJA.TJmax = 150˚C for this device. The typical thermal resistance θJA of this part when board mounted is 52˚C/W for the V52A PLCC package. Note 5: Human body model, 100 pF capacitor discharged through a 1.5 Ω resistor. Note 6: See AN450 “Surface Mounting Methods and Their Effect on Product Reliability” or the section titled “Surface Mount” found in any post 1986 National Semi- conductor Linear Data Book for other methods of soldering surface mount devices. Note 7: A Zener diode clamps the OS analog input to AGND as shown below. This input protection, in combination with the external clamp capacitor and the output impedance of the CCD, prevents damage to the LM9800 from transients during power-up. Note 8: To guarantee accuracy, it is required that VA and VD be connected together to the same power supply with separate bypass capacitors at each supply pin. Note 9: Typicals are at TJ = TA = 25˚C, fMCLK = 20MHz, and represent most likely parametric norm. Note 10: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). DS012498-4 www.national.com 6 |
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