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PR533 Datasheet(PDF) 16 Page - NXP Semiconductors

Part # PR533
Description  USB NFC integrated reader solution
PDF  36 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

PR533 Datasheet(HTML) 16 Page - NXP Semiconductors

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PR533_SDS
All information provided in this document is subject to legal disclaimers.
© NXP Semiconductors N.V. 2014. All rights reserved.
Product short data sheet
COMPANY PUBLIC
Rev. 3.6 — 27 October 2014
206436
16 of 36
NXP Semiconductors
PR533
USB NFC integrated reader solution
10.10 Input/output pin characteristics for P35
[1]
To minimize power consumption when in soft power-down mode, the limit is VDDD  0.4 V.
[2]
To minimize power consumption when in soft power-down mode, the limit is 0.4 V.
[3]
The IOH and IOL give the output driving capability and allow to calculate directly the rise and fall time as function of the load capacitance.
Table 17.
Input/output pin characteristics for P35
Symbol Parameter
Conditions
Min
Typ
Max
Unit
VIH
HIGH-level input voltage
[1] 0.7
 V
DDD
-VDDD
V
VIL
LOW-level input voltage
[2] 0-
0.3
 V
DDD
V
VOH
HIGH-level output volt-
age
VDDD =3V; IOH = 4mA
VDDD  0.4
-
VDDD
V
VOL
LOW-level output voltage VDDD =3V; IOL =4mA
0
-
0.4
V
IIH
HIGH-level input current
VI =VDDD
1-
1
A
IIL
LOW-level input current
VI =0V
1-
1
A
IOH
HIGH-level output current VDDD =3V;
VOH =0.8  VDD(PVDD)
[3]
4-
-
mA
IOL
LOW-level output current VDDD =3V;
VOL =0.2  VDD(PVDD)
[3] 4-
-
mA
ILI
input leakage current
RSTPD_N = 0.4 V
1-
1
A
Ci
input capacitance
-
2.5
-
pF
CL
load capacitance
-
-
30
pF
tr
rise time
VDDD =3V; VOH =0.8  VDDD;
CL =30pF
--
13.5
ns
VDDD =1.8 V; VOH =0.7  VDDD;
CL =30pF
--
10.8
ns
tf
fall time
VDDD =3V; VOL =0.2  VDDD;
CL=30pF
--
13.5
ns
VDDD =1.8 V; VOL =0.3  VDDD;
CL =30pF
--
10.8
ns



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