PR533 datasheet(19/36 Pages) NXP

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PR533_SDS

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Product short data sheet

COMPANY PUBLIC

Rev. 3.6 — 27 October 2014

206436

19 of 36

NXP Semiconductors

PR533

USB NFC integrated reader solution

[1]

The value does not guarantee the power-down consumptions. To reach the specified power-down consumptions, the limit is

VDD(PVDD)  0.4 V.

[2]

The value does not guarantee the power-down consumptions. To reach the specified power-down consumptions, the limit is 0.4 V.

[1]

The IOH and IOL give the output driving capability and allow to calculate directly the rise and fall time as function of the load capacitance

Table 21.

Input Pin characteristics for DP for HSU interface

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIH

HIGH-level input voltage

[1] 0.7

 V

DD(PVDD)

-VDD(PVDD)

VIL

LOW-level input voltage

[2] 0-

0.3

 V

DD(PVDD)

IIH

HIGH-level input current

Vi = VDD(PVDD)

IIL

LOW-level input current

Vi = 0 V

ILI

input leakage current

RSTPD_N = 0 V

11

input capacitance

2.5

3.5

Table 22.

Output Pin characteristics for DM for HSU interface

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VOH

HIGH-level output

voltage

VDD(PVDD) =3V; IOH = 4 mA

VDD(PVDD)  0.4 -

VDD(PVDD)

VDD(PVDD) =1.8 V; IOH = 2 mA

VDD(PVDD)  0.4 -

VDD(PVDD)

VOL

LOW-level output volt-

age

VDD(PVDD) =3V; IOL = 4 mA

0.4

VDD(PVDD) =1.8 V; IOL = 2 mA

0.4

IOH

HIGH-level output

current

VDD(PVDD) =3V;

VOH =0.8  VDD(PVDD)

[1]

4-

VDD(PVDD) =1.8 V;

VOH =0.7  VDD(PVDD)

2-

IOL

LOW-level output cur-

rent

VDD(PVDD) =3.3 V;

VOL =0.2  VDD(PVDD)

[1] 4-

VDD(PVDD) =1.8 V;

VOL =0.3  VDD(PVDD)

ILI

input leakage current

RSTPD_N = 0 V

1-

load capacitance

rise time

VDDP =3V;

VOH =0.8  VDD(PVDD);

CL =30 pF

13.5

VDD(PVDD) =1.8 V;

VOH =0.7  VDD(PVDD);

CL =30 pF

10.8

fall time

VDD(PVDD) =3V;

VOL =0.2  VDD(PVDD);

CL=30pF

13.5

VDDP =1.8 V;

VOL =0.3  VDD(PVDD);

CL =30 pF

10.8

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