PR533_SDS

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Product short data sheet

COMPANY PUBLIC

Rev. 3.6 — 27 October 2014

206436

12 of 36

NXP Semiconductors

PR533

USB NFC integrated reader solution

10.5 RSTPD_N input pin characteristics

10.6 Input pin characteristics for I0, I1 and TESTEN

[1]

[2]

To minimize power consumption when in soft power-down mode, the limit is 0.4 V.

[3]

TESTEN should never be set to high level in the application. It is used for production test purpose only. It is

recommended to connect TESTEN to ground although there is a pull-down included.

Table 12.

RSTPD_N input pin characteristics

Symbol Parameter

Conditions

Min

Typ

Max

Unit

HIGH-level input volt-

age

LOW-level input volt-

age

0-

0.4

V

HIGH-level input cur-

rent

1-

1

A

1-

1

A

input capacitance

-

2.5

-

pF

Table 13.

Input pin characteristics for I0, I1 and TESTEN

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

HIGH-level input voltage

[1] 0.7

 V

DDD

V

LOW-level input voltage

[2] 00.3

 V

DDD

V

HIGH-level input current

I0 and I1;

[3]

1-

1

A

LOW-level input current

1-

1

A

input capacitance

-

2.5

-

pF