AMC7823 datasheet(3/48 Pages) TI

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ELECTRICAL CHARACTERISTICS: +5 V

AMC7823

SLAS453A – APRIL 2005 – REVISED OCTOBER 2005

At –40°C to +85°C, AV

DD = 5 V, DVDD = 5 V, BVDD = 3 V to 5 V, using external 2.5-V reference (unless otherwise noted).

AMC7823

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

ADC ANALOG INPUTS

Input voltage range

2 × VREF

Input impedance

Ω

Input capacitance

Input leakage current

±1

µA

ANALOG-TO-DIGITAL CONVERTER

Resolution

Bits

No missing codes

Bits

Integral linearity

±1

LSB(1)

Differential linearity

±1

LSB

Offset error

±2

LSB

Offset error drift

±4

ppmFS/°C

Offset error match

0.5

LSB

Gain error

±6

LSB

Gain error match

0.3

LSB

Noise

µVRMS

Power-supply rejection

AVDD = 5 V ±5%

Throughput rate

200

kHz

Total conversion time

Scan Channels 0 through 7

µs

Total conversion time including temperature

Scan Channels 0 through 8

µs

Channel-to-channel isolation

VIN = 5 VPP at 10 kHz

0.5

LSB

DIGITAL-TO-ANALOG CONVERTER(2)

Output voltage range

Programmable

2 × VREF

Output current

Refer to Typical Characteristics

±1

Resolution

Bits

Integral linearity(3)

±2

±8

LSB

Monotonicity

Bits

Differential linearity

±0.2

±1

LSB

Output range = 0 to VREF

±0.5

±5

Offset error

Output range = 0 to 2 x VREF

±1

±10

Offset error drift

±4

ppmFS/°C

Gain error

Output range = 0 to 2 x VREF

±0.3

±1.0

%FS

Step between code 0x400 to 0xC00,

Settling time

µs

to ±1 LSB

Code change glitch

1 LSB change, in worst case

nV-s

Overshoot

Step between code 0x400 to 0xC00

200

Crosstalk

Step between code 0x400 to 0xC00

< 0.5

LSB

Sine wave (1 kHz, 5 VPP) generated by

Signal-to-noise ratio

DAC, sampling at 400 kSPS,

RL = 10 kΩ, CL = 100 pF.

Output buffer gain = 2

nV/

√Hz

Output noise voltage density

Output buffer gain = 1

nV/

√Hz

(1)

LSB means least significant bit.

(2)

DAC is tested with load of 25 k

Ω in parallel with 100 pF to ground.

(3)

Measured from code 0x008 to 0xFFF.

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