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FXLS8967AF Datasheet(PDF) 33 Page - NXP Semiconductors

Part # FXLS8967AF
Description  3-Axis Low-g Accelerometer
PDF  98 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

FXLS8967AF Datasheet(HTML) 33 Page - NXP Semiconductors

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NXP Semiconductors
FXLS8967AF
3-Axis Low-g Accelerometer
Field
Description
1
SRC_ASLP
Auto-WAKE/SLEEP event status flag
0: A WAKE-to-SLEEP or SLEEP-to-WAKE system operating mode transition has not occurred.
1: A WAKE-to-SLEEP or a SLEEP-to-WAKE system operating mode transition has occurred.
Reading the
SYS_MODE register allows the host processor to determine if the transition direction
was from WAKE-to-SLEEP or SLEEP-to-WAKE:
• A WAKE-to-SLEEP transition is observed when no configured interrupt event occurs for a time
period (number of ODR periods) that equals the user-specified inactivity time limit programmed
in the
ASLP_COUNT_LSB and ASLP_COUNT_MSB registers. On expiry of configured time
period with no user specified activity, the system transitions to the user-specified SLEEP power
mode (
SENS_CONFIG2[sleep_pm]) and ODR (or decimation and idle time settings when Flexible
Performance mode is selected).
• A SLEEP-to-WAKE transition occurs when a configured interrupt event flag becomes
active. The interrupt event flag transitions to the user-specified WAKE power mode (
SENS_
CONFIG2[wake_pm]) and ODR (or decimation and idle time settings when Flexible Performance
mode is selected).
Notes:
• The SRC_ASLP event flag is cleared by reading the SYS_MODE register.
• The SRC_ASLP event flag is enabled when ASLP_COUNT ≥ 1 which also enables the Auto-
WAKE/SLEEP function. The SRC_ASLP flag is only operational when
INT_EN[ALSP_EN] = 1.
0
SRC_BOOT
System boot complete event flag
0: Boot sequence in process/not complete.
1: Boot sequence completed; FXLS8967AF is now ready to accept commands over the I2C or SPI
interfaces.
This flag is automatically set to 1 upon completion of the boot process and remains set until a POR,
soft reset, or exit from Hibernate mode event occurs.
When BT_MODE = GND: Boot interrupt is generated in INT1/MOT_DET pin by default. This event
flag may be configured to generate an interrupt on either the INT1 or INT2 pin depending on the
mapping selected in
INT_PIN_SEL. When this event flag is enabled as an interrupt output, either the
INT1 or INT2 (depending on the setting made in
INT_PIN_SEL register) pin is pulsed once with a
width of TBOOT1 µs when the boot process completes.
When BT_MODE = VDD: The INT2/BOOT_OUT pin is pulsed once with a duration of TBOOT2 ms when
the boot process completes. The pulse is active low (open-drain output); an external pull-up resistor is
required.
Notes:
• When BT_MODE = GND, after a POR or exiting Hibernate mode, the polarity of the BOOT pulse
is default Active High because any I2C write to the
SENS_CONFIG4[INT_POL] fails until the boot
process has completed.
• After a Soft Reset, the INT_POL, INT_PP_OD, and INT_PIN_SEL register settings are
not reset and maintain their previous values. As a result, an I2C or SPI write to the
SENS_
CONFIG4[(INT_PP_OD and INT_POL bits)] and INT_PIN_SEL[BOOT_INT2] bits before the Soft
Reset determines the logic polarity, output driver type, and INT1/2 pin mapping of the subsequent
Boot pulse.
• It is not possible to observe the state of the SRC_BOOT bit at '0' over the I2C or SPI interfaces as
read and write operations fails until the boot process has completed.
Table 22. INT_STATUS register (address 00h) bit description...continued
FXLS8967AF
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
Objective data sheet
Rev. 1 — 27 April 2021
33 / 98



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