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LTC4261 Datasheet(PDF) 9 Page - Analog Devices |
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LTC4261 Datasheet(HTML) 9 Page - Analog Devices |
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9 / 74 page ![]() LTC4283 9 Rev. B For more information www.analog.com Note 1: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to any Absolute Maximum Rating condition for extended periods may affect device reliability and lifetime. Note 2: All Currents into device pins are positive and all currents out of device pins are negative. All voltages are referenced to VEE unless otherwise specified. Note 3: When VZ is connected to VIN, an internal shunt regulator limits the voltage to a minimum of 11V. Driving the pins above 11V may damage the part. These pins can be safely biased by a higher voltage using a resistor or current source that limits the current below 50mA. Note 4: An internal clamp limits DRAIN to a minimum of 3.2V. Driving this pin to voltages above the clamp may damage the part. The pin can be safely tied to higher voltages through a resistor that limits the current below 1.5mA. Note 5: An internal clamp limits EN# to a minimum of 6V. Driving this pin to voltages above the clamp may damage the part. The pin can be safely tied to higher voltages through a resistor that limits the current below 5mA. Note 6: Guaranteed by design and characterization. Not tested in production. Note 7: Tested at 12-bit resolution and guaranteed for other resolutions by design and characterization. Note 8: EEPROM endurance and retention are guaranteed by design, characterization and correlation with statistical process controls. Note 9: EEPROM endurance and retention will be degraded when TJ > 85°C. I2C TIMING DIAGRAM tSP tBUF tSU,STO tSP tHD,STA START CONDITION STOP CONDITION tSU,STA tHD,DATI tHD,DATO REPEATED START CONDITION REPEATED START CONDITION tSU,DAT SDA SCL tHD,STA 4283 TD ELECTRICAL CHARACTERISTICS |
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