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AD5941 Datasheet(PDF) 16 Page - Analog Devices

Part # AD5941
Description  High Precision, Impedance, and Electrochemical Front End
PDF  134 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD5941 Datasheet(HTML) 16 Page - Analog Devices

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AD5940/AD5941
Data Sheet
Rev. C | Page 16 of 134
Parameter
Symbol
Min
Typ
Max
Unit
Test Conditions/Comments
Low Power Reference
1.65
µA
Low Power DACs for VZERO0 and
VBIAS0
2.3
µA
Low power DAC powered up, excluding load
current
Low Power TIA and
Potentiostat Amplifier
2
µA
Per amplifier, normal mode
1
µA
Per amplifier, half power mode
START-UP TIME
Processor clock = 16 MHz
AFE Wake-Up2
30
ms
Wake-up time to allow communication on SPI
bus
ADC Wake-Up2
80
180
µs
Time delay required on exiting hibernate mode
before starting ADC conversions
1
VBIAS_CAP is only meant for internal biasing within the IC.
2
Guaranteed by design, not production tested.
3
Code distribution can be reduced if ADC output rate is reduced by using sinc2 filter option.
4
ADC offset and gain not calibrated for high power mode in production. User calibration can eliminate this error.
5
There is a correction factor of 1.835 V introduced to the ADC code to voltage conversion as a result of the calibration to the ADC.
6
A 1.835 V/1.82 V factor must be added while performing the calibration.
7
The 1.82 V reference is used to calibrate the ADC offset and gain.
8
If the ADC is calibrated and there is a hardware reset, the calibration registers are cleared to the default value. One way around this clear is to store the calibrated
values in the MCU flash during factory calibration and load those values on power-up.
9
Noise can be reduced if ADC sample rate is reduced using the sinc2 filter. See Table 2 for ADC rms noise: digital filter settings.
10
The low power TIA gain resistor must be calibrated regularly because the resistor has a high temperature drift.
11
See Figure 8 for details.
12
See Figure 10 for details.
13
VBIAS0 can be used for sourcing the offset voltage to external amplifiers.
14
High speed DAC offset calibration can remove this error. See the High Speed DAC Calibration Options section for details.
15
Measured using the box method.
16
The watchdog can be turned off during system initialization.
17
IOVDD can optionally be powered from a 1.8 V supply rail.
ADC RMS NOISE SPECIFICATIONS
The internal 1.82 V reference is used for all measurements.
ADC RMS Noise: Digital Filter Settings
Table 2 provides the rms noise specifications for the ADC with different ADC digital filter settings.
Table 2. ADC RMS Noise1
Update
Rate (Hz)
Sinc3 Oversampling
Rate (OSR)
Sinc2 OSR
Gain = 1 rms
Noise (μV)
Gain = 1.5 rms
Noise (μV)
Gain = 2 rms
Noise (μV)
Gain = 4 rms
Noise (μV)
Gain = 9 rms
Noise (μV)
200,000
4
Not applicable
72.43
49.732
37.83
18.93
8.62
9090
4
22
29.29
19.59
10.4
6.687
4.42
900
5
178
24.0
17.11
12.832
6.416
1.018
1
Noise can be reduced if ADC sample rate is reduced using the sinc2 filter.
ADC RMS Noise: Peak-to-Peak Effective Bits
Table 3 provides the rms and peak-to-peak effective bits based on the noise results in Table 2 for various PGA gain settings (peak-to-peak
effective bits results are shown in parentheses). To calculate the rms bits, use the following equation:
log2 ((2 × Input Range)/RMS Noise)
where:
Input Range is the input voltage range to the ADC.
RMS Noise is the rms of the noise.
To calculate the peak-to-peak effective bits, use the following equation:
log2 ((2 × Input Range)/(6.6 × RMS Noise))



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