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ADC32RF55 Datasheet(PDF) 71 Page - Texas Instruments

Part # ADC32RF55
Description  ADC32RF5x Dual Channel 14-bit 2.6 to 3-GSPS RF Sampling Data Converter
PDF  126 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADC32RF55 Datasheet(HTML) 71 Page - Texas Instruments

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7.3.8 Test Pattern
The ADC32RF5x provides two different options to output test patterns instead of the actual output data of the
ADC in order to simplify the serial interface and system debug of the JESD204B digital interface link. The output
data path is shown in \.
Transport Layer Test
Pattern
Data Mapping
Frame Construction
Scrambler
1+x
14+x15
8b/10b
encoding
Link Layer Test Pattern
Serializer
ADC Section
Transport Layer
Link Layer
PHY Layer
Digital Block
ADC
Decimation
Filter Block
Figure 7-44. Test Pattern Options
The available test patterns in each block are described in Table 7-45. Both test pattern blocks replace output
data from the digital block, and not from the ADC; therefore, it is available in decimation or decimation bypass
mode. The test patterns are synchronized with the SYSREF signal.
Table 7-45. Test Pattern Overview
TEST PATTERN LOCATION
TYPE
8b/10b encoded
REGISTER PAGE
REGISTER
TRANSPORT LAYER
CUSTOM PATTERN
Yes
JESD
0x05 0x04
0x2E, D0
TOGGLE 1010 PATTERN
Yes
0x2E, D1
RAMP PATTERN
Yes
0x2E, D2
LINK LAYER
JESD204B TEST PATTERNS
Depends
0x2D, D2-D0
PRBS PATTERN (27.. 231)
No
0x2F, D6-D4
The RAMP pattern provides two different output options. Internally each ADC data bus consists of parallel data
streams (1 stream per serdes lane). The RAMP pattern is generated for each stream and a different starting
value can be set for each stream. By default, the starting values are 0. For example, a LMFS mode using 4
lanes/ADC would show a slow ramp which increments once every 4 clock cycles with starting values set to 0 and
ramp increment = 1. Also, a RAMP pattern which increments every clock cycle can be set using different starting
values (such as 0, 1, 2, 3) for the 4 streams/lanes and setting the RAMP increment to 4. The follow table shows
how to enable the RAMP test pattern.
Table 7-46. RAMP Test Pattern
ADDR
DATA
DESCRIPTION
0x05
0x04
Select JESD page
0x32
0x01
Set lane DOUT1 starting value = 1
0x34
0x02
Set lane DOUT2 starting value = 2
0x36
0x03
Set lane DOUT3 starting value = 3
0x42
0x01
Set lane DOUT5 starting value = 1
0x44
0x02
Set lane DOUT6 starting value = 2
0x46
0x03
Set lane DOUT7 starting value = 3
0x2E
0x34
Enable RAMP pattern, RAMP increment = 4
7.3.8.1 Transport Layer
The transport layer maps the ADC output data into 8-bit octets and constructs the JESD204B frames using the
LMFS parameters. Tail bits or 0's are added when needed. Alternatively, test patterns can be substituted instead
of the ADC data with the JESD frame, as shown in Table 7-45.
www.ti.com
ADC32RF54, ADC32RF55
SBAS500A – JUNE 2022 – REVISED DECEMBER 2022
Copyright © 2022 Texas Instruments Incorporated
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Product Folder Links: ADC32RF54 ADC32RF55



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