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ADC32RF55 Datasheet(PDF) 71 Page - Texas Instruments |
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ADC32RF55 Datasheet(HTML) 71 Page - Texas Instruments |
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71 / 126 page ![]() 7.3.8 Test Pattern The ADC32RF5x provides two different options to output test patterns instead of the actual output data of the ADC in order to simplify the serial interface and system debug of the JESD204B digital interface link. The output data path is shown in \. Transport Layer Test Pattern Data Mapping Frame Construction Scrambler 1+x 14+x15 8b/10b encoding Link Layer Test Pattern Serializer ADC Section Transport Layer Link Layer PHY Layer Digital Block ADC Decimation Filter Block Figure 7-44. Test Pattern Options The available test patterns in each block are described in Table 7-45. Both test pattern blocks replace output data from the digital block, and not from the ADC; therefore, it is available in decimation or decimation bypass mode. The test patterns are synchronized with the SYSREF signal. Table 7-45. Test Pattern Overview TEST PATTERN LOCATION TYPE 8b/10b encoded REGISTER PAGE REGISTER TRANSPORT LAYER CUSTOM PATTERN Yes JESD 0x05 0x04 0x2E, D0 TOGGLE 1010 PATTERN Yes 0x2E, D1 RAMP PATTERN Yes 0x2E, D2 LINK LAYER JESD204B TEST PATTERNS Depends 0x2D, D2-D0 PRBS PATTERN (27.. 231) No 0x2F, D6-D4 The RAMP pattern provides two different output options. Internally each ADC data bus consists of parallel data streams (1 stream per serdes lane). The RAMP pattern is generated for each stream and a different starting value can be set for each stream. By default, the starting values are 0. For example, a LMFS mode using 4 lanes/ADC would show a slow ramp which increments once every 4 clock cycles with starting values set to 0 and ramp increment = 1. Also, a RAMP pattern which increments every clock cycle can be set using different starting values (such as 0, 1, 2, 3) for the 4 streams/lanes and setting the RAMP increment to 4. The follow table shows how to enable the RAMP test pattern. Table 7-46. RAMP Test Pattern ADDR DATA DESCRIPTION 0x05 0x04 Select JESD page 0x32 0x01 Set lane DOUT1 starting value = 1 0x34 0x02 Set lane DOUT2 starting value = 2 0x36 0x03 Set lane DOUT3 starting value = 3 0x42 0x01 Set lane DOUT5 starting value = 1 0x44 0x02 Set lane DOUT6 starting value = 2 0x46 0x03 Set lane DOUT7 starting value = 3 0x2E 0x34 Enable RAMP pattern, RAMP increment = 4 7.3.8.1 Transport Layer The transport layer maps the ADC output data into 8-bit octets and constructs the JESD204B frames using the LMFS parameters. Tail bits or 0's are added when needed. Alternatively, test patterns can be substituted instead of the ADC data with the JESD frame, as shown in Table 7-45. www.ti.com ADC32RF54, ADC32RF55 SBAS500A – JUNE 2022 – REVISED DECEMBER 2022 Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 71 Product Folder Links: ADC32RF54 ADC32RF55 |
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