Preliminary Technical Data

AD5628/AD5648/AD5668

Rev. PrA| Page 11 of 24

ABSOLUTE MAXIMUM RATINGS

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those listed in the operational sections

of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

Parameter

Rating

-0.3 V to +7 V

Digital Input Voltage to GND

Operating Temperature Range

Industrial (B Version)

-40°C to +105°C

Storage Temperature Range

-65°C to +150°C

+150°C

TSSOP Package

Power Dissipation

150.4°C/W

Lead Temperature, Soldering

Vapor Phase (60 sec)

+215°C

Infrared (15 sec)

+220°C

ESD CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the

human body and test equipment and can discharge without detection. Although this product features

proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy

electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance

degradation or loss of functionality.

TERMINOLOGY

Relative Accuracy

For the DAC, relative accuracy or Integral Nonlinearity (INL) is a

measure of the maximum deviation, in LSBs, from a straight line

passing through the endpoints of the DAC transfer function. A

typical INL vs. code plot can be seen in Figure 2.

Differential Nonlinearity

Differential Nonlinearity (DNL) is the difference between the

measured change and the ideal 1 LSB change between any two

adjacent codes. A specified differential nonlinearity of ±1 LSB

maximum ensures monotonicity. This DAC is guaranteed

monotonic by design. A typical DNL vs. code plot can be seen in

Figure 3.

Offset Error

Offset error is a measure of the difference between VOUT

(actual) and VOUT (ideal) expressed in mV in the linear

region of the transfer function. Offset error is measured on

the AD5668 with Code ??? loaded into the DAC register.

This is a measure of the offset error of the DAC and the output

amplifier (see Figures 2 and 3). It can be negative or positive, and is

expressed in mV.

Zero-Code Error

Zero-code error is a measure of the output error when zero code

(0000Hex) is loaded to the DAC register. Ideally the output should

be 0 V. The zero-code error is always positive in the AD56x8

because the output of the DAC cannot go below 0 V. It is due to a

combination of the offset errors in the DAC and output amplifier.

Zero-code error is expressed in mV. A plot of zero-code error vs.

temperature can be seen in Figure 6.

Gain Error

This is a measure of the span error of the DAC. It is the deviation

in slope of the DAC transfer characteristic from ideal expressed as

a percent of the full-scale range.

Zero-Code Error Drift

This is a measure of the change in zero-code error with a change in

temperature. It is expressed in µV/°C.

Gain Error Drift

This is a measure of the change in gain error with changes in

temperature. It is expressed in (ppm of full-scale range)/°C.

Full-Scale Error

Full-scale error is a measure of the output error when full-scale

code (FFFF Hex) is loaded to the DAC register. Ideally the output

full-scale range. A plot of full-scale error vs. temperature can be

seen in Figure 6.

Total Unadjusted Error

Total Unadjusted Error (TUE) is a measure of the output error