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ISL70219ASEHF/PROTO Datasheet(PDF) 7 Page - Renesas Technology Corp

Part # ISL70219ASEHF/PROTO
Description  40V Radiation Hardened and SET Enhanced, Precision Low-Power Operational Amplifier
PDF  25 Pages
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Manufacturer  RENESAS [Renesas Technology Corp]
Direct Link  http://www.renesas.com
Logo RENESAS - Renesas Technology Corp

ISL70219ASEHF/PROTO Datasheet(HTML) 7 Page - Renesas Technology Corp

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ISL70219ASEH
FN8459 Rev. 2.00
Page 7 of 25
Jun 11, 2018
TRANSIENT RESPONSE
Slew Rate, VOUT 20% to 80%
SR
AV = 1, RL = 2kΩVO = 4VP-P
(Note 9)
-0.5
-
V/µs
Rise Time
10% to 90% of VOUT
tr, tf,
Small Signal
AV = 1, VOUT = 50mVP-P,
RL = 10kΩ to VCM (Note 9)
-
130
-
ns
Fall Time
90% to 10% of VOUT
AV = 1, VOUT = 50mVP-P, RL = 10kΩ
to VCM (Note 9)
-
130
-
ns
Settling Time to 0.1%
4V Step; 10% to VOUT
ts
AV = -1, VOUT = 4VP-P, RL = 5kΩ to
VCM (Note 9)
-12
-
µs
Settling Time to 0.01%
4V Step; 10% to VOUT
AV = -1, VOUT = 4VP-P, RL = 5kΩ to
VCM (Note 9)
-19-
µs
Output Positive Overload Recovery
Time
tOL
AV = -100, VIN = 0.2VP-P, RL = 2kΩ
to VCM (Note 9)
-7-
µs
Output Negative Overload Recovery
Time
AV = -100, VIN = 0.2VP-P, RL = 2kΩ
to VCM (Note 9)
-5.8
-
µs
Positive Overshoot
OS+
AV = 1, VOUT = 10VP-P, Rf = 0Ω
RL =2kΩto VCM (V)
-15-
%
Negative Overshoot
OS-
AV = 1, VOUT = 10VP-P, Rf = 0Ω
RL =2kΩto VCM (Note 9)
-15-
%
Electrical Specifications ±5.0V V
S = ±5.0V, VCM = VO = 0V, RL = Open, TA = +25°C, unless otherwise noted. Boldface limits apply
across the operating temperature range, -55°C to +125°C; over a total ionizing dose of 300krad(Si) with exposure at a high dose rate of 50rad(Si)/s to
300rad(Si)/s or over a total ionizing dose of 50krad(Si) with exposure at a low dose rate of <10mrad(Si)/s, unless otherwise noted. (Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
(Note 8)TYP
MAX
(Note 8)UNIT
Electrical Specifications ±2.25V V
S = ±2.25V, VCM = VO = 0V, RL = Open, TA= +25°C, unless otherwise noted. Boldface limits apply
across the operating temperature range, -55°C to +125°C; over a total ionizing dose of 300krad(Si) with exposure at a high dose rate of 50rad(Si)/s to
300rad(Si)/s or over a total ionizing dose of 50krad(Si) with exposure at a low dose rate of <10mrad(Si)/s, unless otherwise noted.
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
(Note 8)TYP
MAX
(Note 8)UNIT
Input Offset Voltage
VOS
-
10
150
µV
-
250
µV
Offset Voltage Drift
TCVOS
(Note 9)
-
0.1
1
µV/°C
Input Bias Current
IB
TA = +25°C
-2.50
0.18
2.50
nA
TA = -55°C, +125°C
-5
-
5
nA
TA = +25°C, post HDR/LDR Rad
-15
-
15
nA
Input Bias Current Temperature
Coefficient
TCIB
(Note 9)
-5
1
5
pA/°C
Input Offset Current
IOS
TA = +25°C
-2.5
0.3
2.5
nA
TA = -55°C, +125°C
-3
-
3
nA
TA = +25°C, post HDR/LDR Rad
-10
-
10
nA
Input Offset Current Temperature
Coefficient
TCIOS
(Note 9)
-3
0.42
3
pA/°C
Input Voltage Range
VCM
Guaranteed by CMRR Test
-0.25
-
0.25
V
Common-Mode Rejection Ratio
CMRR
VCM = -0.25V to +0.25V
90
110
-
dB
90
--
dB



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