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ISL70219ASEHF/PROTO Datasheet(PDF) 7 Page - Renesas Technology Corp |
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ISL70219ASEHF/PROTO Datasheet(HTML) 7 Page - Renesas Technology Corp |
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7 / 25 page ![]() ISL70219ASEH FN8459 Rev. 2.00 Page 7 of 25 Jun 11, 2018 TRANSIENT RESPONSE Slew Rate, VOUT 20% to 80% SR AV = 1, RL = 2kΩVO = 4VP-P (Note 9) -0.5 - V/µs Rise Time 10% to 90% of VOUT tr, tf, Small Signal AV = 1, VOUT = 50mVP-P, RL = 10kΩ to VCM (Note 9) - 130 - ns Fall Time 90% to 10% of VOUT AV = 1, VOUT = 50mVP-P, RL = 10kΩ to VCM (Note 9) - 130 - ns Settling Time to 0.1% 4V Step; 10% to VOUT ts AV = -1, VOUT = 4VP-P, RL = 5kΩ to VCM (Note 9) -12 - µs Settling Time to 0.01% 4V Step; 10% to VOUT AV = -1, VOUT = 4VP-P, RL = 5kΩ to VCM (Note 9) -19- µs Output Positive Overload Recovery Time tOL AV = -100, VIN = 0.2VP-P, RL = 2kΩ to VCM (Note 9) -7- µs Output Negative Overload Recovery Time AV = -100, VIN = 0.2VP-P, RL = 2kΩ to VCM (Note 9) -5.8 - µs Positive Overshoot OS+ AV = 1, VOUT = 10VP-P, Rf = 0Ω RL =2kΩto VCM (V) -15- % Negative Overshoot OS- AV = 1, VOUT = 10VP-P, Rf = 0Ω RL =2kΩto VCM (Note 9) -15- % Electrical Specifications ±5.0V V S = ±5.0V, VCM = VO = 0V, RL = Open, TA = +25°C, unless otherwise noted. Boldface limits apply across the operating temperature range, -55°C to +125°C; over a total ionizing dose of 300krad(Si) with exposure at a high dose rate of 50rad(Si)/s to 300rad(Si)/s or over a total ionizing dose of 50krad(Si) with exposure at a low dose rate of <10mrad(Si)/s, unless otherwise noted. (Continued) PARAMETER SYMBOL TEST CONDITIONS MIN (Note 8)TYP MAX (Note 8)UNIT Electrical Specifications ±2.25V V S = ±2.25V, VCM = VO = 0V, RL = Open, TA= +25°C, unless otherwise noted. Boldface limits apply across the operating temperature range, -55°C to +125°C; over a total ionizing dose of 300krad(Si) with exposure at a high dose rate of 50rad(Si)/s to 300rad(Si)/s or over a total ionizing dose of 50krad(Si) with exposure at a low dose rate of <10mrad(Si)/s, unless otherwise noted. PARAMETER SYMBOL TEST CONDITIONS MIN (Note 8)TYP MAX (Note 8)UNIT Input Offset Voltage VOS - 10 150 µV - 250 µV Offset Voltage Drift TCVOS (Note 9) - 0.1 1 µV/°C Input Bias Current IB TA = +25°C -2.50 0.18 2.50 nA TA = -55°C, +125°C -5 - 5 nA TA = +25°C, post HDR/LDR Rad -15 - 15 nA Input Bias Current Temperature Coefficient TCIB (Note 9) -5 1 5 pA/°C Input Offset Current IOS TA = +25°C -2.5 0.3 2.5 nA TA = -55°C, +125°C -3 - 3 nA TA = +25°C, post HDR/LDR Rad -10 - 10 nA Input Offset Current Temperature Coefficient TCIOS (Note 9) -3 0.42 3 pA/°C Input Voltage Range VCM Guaranteed by CMRR Test -0.25 - 0.25 V Common-Mode Rejection Ratio CMRR VCM = -0.25V to +0.25V 90 110 - dB 90 -- dB |
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