ISL70219ASEH

FN8459 Rev. 2.00

Page 19 of 25

Jun 11, 2018

Post Low Dose Rate Radiation Characteristics Unless otherwise specified, V

S ± 19.8V, VCM =0,

VO = 0V, TA = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This data is intended to show typical

parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.

FIGURE 60. SUPPLY CURRENT SHIFT vs LDR RADIATION

FIGURE 61. OFFSET VOLTAGE SHIFT vs LDR RADIATION

FIGURE 62. POSITIVE INPUT BIAS CURRENT SHIFT vs LDR RADIATION

FIGURE 63. NEGATIVE INPUT BIAS CURRENT SHIFT vs LDR RADIATION

FIGURE 64. INPUT OFFSET CURRENT SHIFT vs LDR RADIATION

-0.10

-0.08

-0.06

-0.04

-0.02

0.00

0.02

0.04

0.06

0.08

0.10

0

102030

4050

60

708090

100

krad(Si)

GND

BIASED

-15

-10

-5

0

5

10

15

0

102030405060708090

100

krad(Si)

GND

BIASED

-15

-10

-5

0

5

10

15

0

1020

304050

60708090

100

krad(Si)

GND

BIASED

-15

-10

-5

0

5

10

15

0

1020

3040506070

80

90

100

krad(Si)

GND

BIASED

-1.00

-0.80

-0.60

-0.40

-0.20

0.00

0.20

0.40

0.60

0.80

1.00

0

1020

3040

5060708090

100

krad(Si)

GND

BIASED