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OPA830 Datasheet(PDF) 33 Page - Texas Instruments |
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OPA830 Datasheet(HTML) 33 Page - Texas Instruments |
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33 / 56 page ![]() 8.2.1.2 Detailed Design Procedure • Set the total R G value near the high gain values using Table 8-1. This 178-Ω total must be split for a center tap to increase the common-mode noise gain, as shown by the 88.7-Ω value in Figure 8-4. • Set RF using a standard value near the calculated from solving Equation 1 using half of the total RG value. • Simulate the common-mode noise with different elements on the RG center tap as shown in Figure 8-5. Decide which is most appropriate to the application. The common-mode loop instability without the RG center tap is not often apparent in the closed-loop differential simulations. The common-mode loop instability without the RG center tap can often be detected in a common- mode output-noise simulation as Figure 8-5 shows. Grounding the inputs Figure 8-4 and running an output-noise simulation for the common-mode tap point in Figure 8-3 shows a peaking in the noise at high frequency. This peaking indicates low-phase margin for the common-mode loop. Figure 8-5 shows this peaking in the lowest noise curve, with two options for improving phase margin. The first option used in Figure 8-4 is a capacitor to ground set to increase the common-mode noise gain only at higher frequencies. This increase can be seen by the peaking in the common-mode noise of Figure 8-5. Another alternative is to provide a dc voltage reference on the RG center tap. This method raises the common-mode noise gain from dc and beyond. Neither of these latter two options show any evidence of low phase-margin peaking. These two options do increase the output common-mode noise significantly at lower frequencies. Typically, an increase in output common-mode noise is more acceptable than low-phase margin because the next stage (FDA, ADC, differential to single stage) rejects common-mode noise. Using the 10-nF center tap capacitor, Figure 8-6 shows the differential I/O small-signal response showing the expected 300 MHz / 41 ≈ 7.3 MHz closed-loop bandwidth. The capacitor to ground between the RG elements does not impact the differential frequency response. 8.2.1.3 Application Curves Frequency (Hz) 0 20 40 60 80 100 120 140 160 180 10k 100k 1M 10M 100M Diff No center tap 10 nF Ground Figure 8-5. Common-Mode Output Noise for Differential I/O Design Frequency (MHz) 12 15 18 21 24 27 30 33 1 10 100 D074 Figure 8-6. Differential Small-Signal Frequency Response www.ti.com OPA838 SBOS867D – AUGUST 2017 – REVISED SEPTEMBER 2024 Copyright © 2024 Texas Instruments Incorporated Submit Document Feedback 33 Product Folder Links: OPA838 |
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