PCM1870 datasheet(2/52 Pages) TI2

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ABSOLUTE MAXIMUM RATINGS

RECOMMENDED OPERATING CONDITIONS

PCM1870

SLAS544A – MAY 2007 – REVISED SEPTEMBER 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more

susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

over operating free-air temperature range (unless otherwise noted)

(1)

PCM1870

UNIT

VDD, VIO, VCC

Supply voltage

–0.3 to 4

Ground voltage differences: DGND, AGND, PGND

±0.1

Input voltage

–0.3 to 4

Input current (any pins except supplies)

±10

Ambient temperature under bias

–40 to 110

°C

Storage temperature

–55 to 150

°C

Junction temperature

150

°C

Lead temperature (soldering)

260 / 5

°C / s

Package temperature (reflow, peak)

260

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicted under recommended operating

conditions is not impled. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliabiltiy.

MIN

NOM

MAX

UNIT

VCC

Analog supply voltage

2.4

3.3

3.6

VDD, VIO

Digital supply voltage

1.71

3.3

3.6

Digital input logic family

CMOS

SCKI system clock

3.072

18.432

MHz

Digital input clock frequency

LRCK sampling clock

kHz

Digital output load capacitance

Operating free-air temperature

–40

°C

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