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L9965P Datasheet(PDF) 48 Page - STMicroelectronics

Part # L9965P
Description  Automotive single channel pyro-fuse driver
PDF  104 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9965P Datasheet(HTML) 48 Page - STMicroelectronics

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3.7.2.6
Pyro deployment FETs test
This step aims at verifying that HS and LS FETs can be switched ON/OFF.
This test requires HWSC (hardware self-check) prior to execution to cover possible faults determining VRCM out
of range. It also requires the VRCM check to verify that diagnostic currents are in range. To achieve safety
targets, it is strongly recommended to apply such a strategy before running this test.
Figure 23. HS/LS deployment FETs test
HS PMOS
LS NMOS
VVRCM_REF
0
1
o_pf_pr_sel
PF
RPYRO
PR
PGND
CESD
CESD
PS
The diagnostic works as follows:
PF (HS) switch test:
The VRCM is connected to PF pin.
The HS FET is turned ON.
The VRCM sinks current trying to maintain VVRCM_REF.
If the FET is working properly, this current exceeds the threshold ILEAK_SINK_TH for the filter time
tFET_TEST_FLT, the PF_FET_STB flag is set and the HS FET is turned off immediately.
PR (LS) switch test:
The VRCM is connected to PR pin.
The LS FET is turned ON.
The VRCM sources current trying to maintain VVRCM_REF.
If the FET is working properly, this current exceeds the threshold ILEAK_SOURCE_TH for the filter time
tFET_TEST_FLT, the PR_FET_STG flag is set and the LS FET is turned off immediately.
The FETs test diagnostic step duration is tFET_TEST.
In both tests the current on PF and PR pins will not exceed the VRCM current limits IVRCM_SOURCE_LIM or
IVRCM_SINK_LIM. During FETs test, energy available to the load is limited to less than EFET_TEST.
L9965P
Functional description
DS14702 - Rev 4
page 48/104



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