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L9965P Datasheet(PDF) 82 Page - STMicroelectronics

Part # L9965P
Description  Automotive single channel pyro-fuse driver
PDF  104 Pages
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Manufacturer  STMICROELECTRONICS [STMicroelectronics]
Direct Link  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L9965P Datasheet(HTML) 82 Page - STMicroelectronics

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3.16
Software reset (SW_RST)
It is possible to reset the configuration of the device sending a SW_RST sequence.
Once triggered, the software reset procedure resets all SPI registers to their default values, including diagnostic
fault flags and lock protected bit fields.
To reset the device configuration, the following procedure shall be implemented:
1. MCU writes 0xE1 into the SPECIAL_KEY register to enter partial reset mode.
2. MCU writes 0x1E into the SPECIAL_KEY register to confirm the reset.
Frames must be sent exactly in this sequence, otherwise registers will not be reset.
User software can eventually trigger a redownload of the configuration from the non-volatile memory (NVM).
Note:
Since the NVM is redownloaded at each wake-up, the new configuration eventually applied shall be pushed into
the memory with a “write” instruction. Otherwise, the old configuration will be restored at the next wake-up event.
3.17
Configuration integrity check (CONF_CRC)
To guarantee the integrity over time of NVM downloaded trimming/calibration and configuration data, both safety
relevant and latent register content is automatically and cyclically checked against corruption within NORMAL
mode. This is possible because local register data is provided with a CRC signature, that is checked every
tCONF_CRC_PERIOD, while no operation on the NVM is being performed (NVM circuit in reset state).
The duration of the calculation is tCONF_CRC_TIME.
In case of check failure, the following actions are performed:
In case trimming/calibration data has failed the CRC signature check, CYC_TRIM_CAL_CRC_FAIL latch is
set (clear-upon-read).
In case IC configuration data has failed the CRC signature check, CYC_CFG_CRC_FAIL latch is set
(clear-upon-read).
In both cases, the deployment is inhibited and FAULTN is asserted but there is no interruption/inhibition of
other IC functionalities.
In case of permanent data corruption, failure latch set pulse occurs every tCONF_CRC_PERIOD.
The local register CRC signature is managed in the following way:
Every time NVM data is downloaded into local registers (either automatically or user-driven), a CRC
signature is refreshed as well and written in the CLIENT_CONFIG_CRC bit field.
Every time the user changes the local register data, the corresponding CRC signature is not automatically
updated, thus a CRC check failure is expected at the next execution cycle. By the way, as the user triggers
the NVM upload and refresh operation, after the NVM sector CRC has been automatically updated, the
local register CRC signature is updated accordingly and no further CRC check failure is expected.
The integrity check can be disabled by setting CYC_CRC_DIS = 1. After the diagnostic has been disabled, it is
still possible to clear-upon-read both CYC_TRIM_CAL_CRC_FAIL and CYC_CFG_CRC_FAIL. Disabling such
diagnostic can be useful to mask systematic CRC failure detection when updating IC configurations. The
deployment inhibition is removed. On the other hand, leaving it enabled while updating register configurations
may be used as a fault injection strategy to assess the correct functionality of the diagnostics.
3.17.1
Configuration integrity check electrical parameters
All parameters are tested and guaranteed in the following conditions, unless otherwise noted: all supplies
according to the Table 3; TJ according to the Table 2.
Table 88. Configuration integrity check characteristics
Symbol
Parameter
Test condition
Min
Typ
Max
Unit
tCONF_CRC_PERIOD
Configuration integrity check period
Tested by SCAN
-
4
-
ms
tCONF_CRC_TIME
Configuration integrity check time
Tested by SCAN
175
190
210
µs
3.18
Non-volatile memory (NVM)
The IC allows saving key configuration parameters in the internal NVM.
L9965P
Functional description
DS14702 - Rev 4
page 82/104



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