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L9965P Datasheet(PDF) 55 Page - STMicroelectronics |
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L9965P Datasheet(HTML) 55 Page - STMicroelectronics |
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55 / 104 page  3.7.3 Diagnostic routine electrical parameters All parameters are tested and guaranteed in the following conditions, unless otherwise noted: all supplies according to the Table 3; TJ according to the Table 2. Table 30. Diagnostic routine electrical parameters Symbol Parameter Test condition Min Typ Max Unit Pin tDIAG_ROUTINE_PERIOD_00 Diagnostic routine execution period in NORMAL DIAG_ROUTINE_PERIOD = 00 85 100 115 ms - tDIAG_ROUTINE_PERIOD_01 DIAG_ROUTINE_PERIOD = 01 255 300 345 ms - tDIAG_ROUTINE_PERIOD_10 DIAG_ROUTINE_PERIOD = 10 425 500 575 ms - tDIAG_ROUTINE_PERIOD_11 DIAG_ROUTINE_PERIOD = 11 595 700 805 ms - NCYCLE_00 Cyclic periodicity configuration <DIAG_X>_NCYCLE = 00 - 1 - cycles - NCYCLE_01 <DIAG_X>_NCYCLE = 01 - 4 - cycles - NCYCLE_10 <DIAG_X>_NCYCLE = 10 - 16 - cycles - NCYCLE_11 <DIAG_X>_NCYCLE = 11 - 64 - cycles - tABIST ABIST duration - 0.3 - ms - ERRHWSC ADC HWSC error -52 - 52 LSB PS, PF, PR, PGND tHWSC HWSC time duration - 1.5 - ms PS, PF, PR, PGND IPF_PU PF pullup diagnostic current 38 40 42 mA PF SRIPF_PU PF pullup diag current slew rate 150 200 250 µA/µs PF IPR_PD PR pulldown diagnostic current 50 75 100 mA PR VVRCM_REF VRCM regulated voltage 2.25 2.5 2.75 V PF, PR IVRCM_SOURCE_LIM VRCM source current limitation -20 - -10 mA PF, PR IVRCM_SINK_LIM VRCM sink current limitation 10 - 20 mA PF, PR tVRCM_LEAK_FLT Deglitch filter time for STB/STG detection Guaranteed by SCAN 17 20 23 µs PF, PR tVRCM_CHECK VRCM check time duration - - 1.6 ms PF, PR ILEAK_SOURCE_TH Leakage to ground (STG) threshold for VRCM regulator 57 - 145 µA PF, PR ILEAK_SINK_TH Leakage to battery (STB) threshold for VRCM regulator 57 - 145 µA PF, PR RLEAK_TH Equivalent leakage resistance threshold Application information Detection is guaranteed below minimum No detection is guaranteed above maximum 15 - 48 kΩ PF, PR L9965P Functional description DS14702 - Rev 4 page 55/104 |
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