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DAC39RF10 Datasheet(PDF) 197 Page - Texas Instruments

Part # DAC39RF10
Description  DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface
PDF  232 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

DAC39RF10 Datasheet(HTML) 197 Page - Texas Instruments

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Offset Frequency (Hz)
1x102
1x103
1x104
1x105
1x106
1x107
1x108
-180
-170
-160
-150
-140
-130
-120
NRZ DEM/Dither off
NRZ DEM/Dither on
DES2XL DEM/Dither off
DES2XL DEM/Dither on
fCLK = 10.24GHz
Figure 9-5. Phase Noise vs Offset Frequency at 1GHz
There are 3 small disadvantages of DES2XL and DES2XH modes to be aware of:
1. the attenuation of the signal in the transition band of the DES interpolation filter between 0.4*FCLK and
0.6*FCLK
2. An increased latency of 97 clock cycles. or 9.7ns with a 10GHz clock, due to the DES interpolation filter
3. An increase in power of 250mW with a 10GHz clock, due to the DES interpolation filter
9.1.4 Eye Scan Procedure
The PHY layer contains features for generating eye diagrams. A variety of different modes are supported (see
ES register for list of modes). The following sections describe how to generate eye-scan data from the part and
some approaches for building an eye-diagram.
1. Configure the part for JESD204C operation by following the steps in the Startup Procedure for DUC Mode.
Return here after setting JESD_EN=1. Eye-scan can be run with JESD204C bitstreams, but can also work
with general PRBS input stimulus. Eye-scan is run on all enabled physical lanes simultaneously.
2. Program ES to the desired eye-scan mode.
3. If ES is less than 8, you must program ESVO to the desired voltage offset. For other modes, the eye-scan
logic automatically adjusts the voltage offset of the eye-scan sampler.
4. Program ESPO to the desired phase offset.
5. Program ES_BIT_SELECT to a value from 0 to 19. Eye-scan analyzes every 20th received bit (decimate-
by-20). ES_BIT_SELECT adjusts this decimation phase. For random stimulus, this does not impact the
results. If the input has repeating patterns, this can affect the results.
6. Program ESLEN to the desired number of samples. Higher settings give more consistent results.
7. Set ECOUNT_CLR = 1 then set ECOUNT_CLR to clear the error counter. This step is recommended, but
can be skipped if desired (e.g. to add up counts from multiple eye scan runs). This can also be skipped if
ECOUNT won’t be used (for modes with ES of 8 or greater)
8. Program ESRUN = 1 to start the scan.
9. Poll ESDONE until ESDONE returns 1 for each of the lanes you want to run eye-scan on.
10. If the selected eye-scan mode modified the eye-scan voltage offset (inner/outer/average modes), read
ESVO_S to get the inner/outer/average eye boundary. For other eye-scan modes, read ECOUNT to return
the number of mismatches (or matches) recorded.
11. Program ESRUN = 0.
12. Return to step 2 to run another eye-scan data collection process. The receiver can remain enabled during
multiple iterations of steps 2-12.
There are two basic approaches to build an eye diagram using the eye-scan feature.
www.ti.com
DAC39RF10-SP, DAC39RF10-SEP
DAC39RFS10-SP, DAC39RFS10-SEP
SBAS932A – MARCH 2024 – REVISED FEBRUARY 2026
Copyright © 2026 Texas Instruments Incorporated
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Product Folder Links: DAC39RF10-SP DAC39RF10-SEP DAC39RFS10-SP DAC39RFS10-SEP



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