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DAC39RF10 Datasheet(PDF) 199 Page - Texas Instruments

Part # DAC39RF10
Description  DAC39RFx10-SP DAC39RFx10-SEP 10.4 or 20.8GSPS, 16-bit, Dual and Single Channel, Multi-Nyquist Digital-to-Analog Converter (DAC) with JESD204C Interface
PDF  232 Pages
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Manufacturer  TI2 [Texas Instruments]
Direct Link  https://www.ti.com
Logo TI2 - Texas Instruments

DAC39RF10 Datasheet(HTML) 199 Page - Texas Instruments

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disabled, low level spurs from the disabled channel can feed into the active channel, creating spurs around -80
dBFS.
The TX ENABLE function, either through the TXEN0/1 balls or TX_EN registers, provides a method to quickly
disable the DAC output by forcing the digital code to 0 (midscale) (see Section 6.9 for the TX ENABLE
latency). When the QUITE_TX_ENABLE register is 0, a low level signal is still maintained at the output to
prevent saturation. When QUITE_TX_ENABLE is 1, if data independent DEM and Dither is enable, this prevents
asymmetric aging. If DEM and dither are disabled or DEM is set to data dependent DEM, the DAC can degrade
over the lifetime of the device if a significant faction of the lifetime is spent in this mode. The degradation is
channel specific, only affecting the channel that is disabled.
Table 9-1. DAC Sleep and Output Disable Options
Option
MXMODE TX_EN
QUIET_TX_DISABLE
DEM
DITHER
Low level
output
long term
degradation
Power
Savings
Device Full Power Down
(MODE = 0b11)
-
-
-
-
-
yes
no
Most
DAC disable
6
1
-
-
-
yes
no
Some
TX Enable
any
0
0
-
-
yes
no
Least
TX Enable
0-5
0
1
0,1
0,1
no
no
Least
TX Enable
0-5
0
1
2, 3
3
no
yes
Least
TX Enable
6
0
1
0,1
0,1
no
no
Least
TX Enable
6
0
1
2,3
3
no
yes
Least
When the DAC is in full power down, the common mode voltage at the DAC output during sleep needs to be
maintained below 2V. For AC coupled outputs, the bias is usually provided by an inductor or a balun center tap
to 1.8V which forces the common mode also to 1.8V. For DC coupled output, which are typically terminated
through a resistor to a voltage above 1.8V (for example, 2.3V), sufficient DAC output current must be provided
to reduce the common mode voltage to less than 2V. This is achieved by programming DACx_CBIAS_SLEEP
(Address 0x724 bits 7:4 for DACA and Address 0x726 bits 7:4 for DACB) according to the following equation:
DAC_CBIAS_SLEEP = ceil  2∙VBIAS−VOUT_CM_SLEEP
RTERM  − 7.36mA
1.47mA
(4)
where:
• VOUT_SLEEP is the DAC output common mode in sleep (≤ 2V)
• VBIAS is the external DC bias
• RTERM is the external bias resistor/termination to VBIAS
• ceil is the ceiling operator (integer round up)
9.1.7 Radiation Environment Recommendations
Careful consideration must be given to the environmental conditions when using a product in a radiation
environment. Table 9-2 provides a summary of radiation tolerance for device features.
Table 9-2. Summary of Radiation Tolerance
Feature
Radiation Tolerance
Writable SPI registers
(excluding write-to-clear registers)
Implemented with upset immune flip flops. Radiation does not alter
the state.
Read-only SPI registers that return constant values
Radiation does not alter the state (that is, CHIP_TYPE, CHIP_ID,
CHIP_VERSION, VENDOR_ID)
www.ti.com
DAC39RF10-SP, DAC39RF10-SEP
DAC39RFS10-SP, DAC39RFS10-SEP
SBAS932A – MARCH 2024 – REVISED FEBRUARY 2026
Copyright © 2026 Texas Instruments Incorporated
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Product Folder Links: DAC39RF10-SP DAC39RF10-SEP DAC39RFS10-SP DAC39RFS10-SEP



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