AD9265 datasheet(33/44 Pages) AD

33 / 44 page

AD9265

Rev. A | Page 33 of 44

BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST

The AD9265 includes built-in test features designed to enable

verification of the integrity of the part as well as facilitate board

level debugging. A BIST (built-in self-test) feature is included that

verifies the integrity of the digital datapath of the AD9265. Various

output test options are also provided to place predictable values on

the outputs of the AD9265.

BUILT-IN SELF-TEST (BIST)

The BIST is a thorough test of the digital portion of the selected

AD9265 signal path. When enabled, the test runs from an internal

pseudorandom noise (PN) source through the digital datapath

starting at the ADC block output. The BIST sequence runs for

512 cycles and stops. The BIST signature value is placed in

The outputs are not disconnected during this test, so the PN

sequence can be observed as it runs. The PN sequence can be

continued from its last value or reset from the beginning, based

on the value programmed in Register 0x0E, Bit 2. The BIST

signature result varies based on the part configuration.

OUTPUT TEST MODES

The output test options are shown in Table 17. When an output

test mode is enabled, the analog section of the ADC is discon-

nected from the digital back end blocks and the test pattern is run

through the output formatting block. Some of the test patterns are

subject to output formatting, and some are not. The seed value for

the PN sequence tests can be forced if the PN reset bits are used

to hold the generator in reset mode by setting Bit 4 or Bit 5 of

an analog signal (if present, the analog signal is ignored), but

they do require an encode clock. For more information, see

AN-877 Application Note, Interfacing to High Speed ADCs via SPI.

AD9265 Datasheet(PDF) 33 Page - Analog Devices