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KAI-08051 Datasheet(PDF) 16 Page - ON Semiconductor |
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KAI-08051 Datasheet(HTML) 16 Page - ON Semiconductor |
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16 / 35 page ![]() KAI−08051 www.onsemi.com 16 TEST DEFINITIONS Test Regions of Interest Image Area ROI: Pixel (1, 1) to Pixel (3320, 2496) Active Area ROI: Pixel (13, 13) to Pixel (3308, 2484) Center ROI: Pixel (1611, 1199) to Pixel (1710, 1298) Only the Active Area ROI pixels are used for performance and defect tests. Overclocking The test system timing is configured such that the sensor is overclocked in both the vertical and horizontal directions. See Figure 15 for a pictorial representation of the regions of interest. Figure 15. Regions of Interest 12 buffer rows 12 buffer rows 12 dark rows VOUTa 12 dark rows 3296 x 2472 Active Pixels 1, 1 13, 13 Pixel Pixel VOUTc |
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