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ADS5474IPFPR Datasheet(PDF) 10 Page - Texas Instruments |
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ADS5474IPFPR Datasheet(HTML) 10 Page - Texas Instruments |
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10 / 41 page ![]() ADS5474 SLAS525C – JULY 2007 – REVISED JANUARY 2016 www.ti.com Electrical Characteristics (continued) Typical values at TA = 25°C: minimum and maximum values over full temperature range TMIN = –40°C to TMAX = 85°C, sampling rate = 400 MSPS, 50% clock duty cycle, AVDD5 = 5 V, AVDD3 = 3.3 V, DVDD3 = 3.3 V, –1 dBFS differential input, and 3-VPP differential clock, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT RMS idle-channel noise Inputs tied to common-mode 1.8 LSB DIGITAL OUTPUTS VOD Differential output voltage (±) 247 350 454 mV VOC Common-mode output voltage 1.125 1.375 V DIGITAL INPUTS VIH High level input voltage PWD (pin 33) 2 V VIL Low level input voltage PWD (pin 33) 0.8 V IIH High level input current PWD (pin 33) 1 μA IIL Low level input current PWD (pin 33) –1 μA Input capacitance PWD (pin 33) 2 pF 6.6 Timing Characteristics Typical values at TA = 25°C: minimum and maximum values over full temperature range TMIN = –40°C to TMAX = 85°C, sampling rate = 400 MSPS, 50% clock duty cycle, AVDD5 = 5 V, AVDD3 = 3.3 V, DVDD3 = 3.3 V, and 3-VPP differential clock, unless otherwise noted. (1) TEST CONDITIONS MIN NOM MAX UNIT ta Aperture delay 200 ps Aperture jitter, rms Internal jitter of the ADC 103 fs Latency 3.5 cycles tCLK Clock period 2.5 50 ns tCLKH Clock pulse duration, high 1 ns tCLKL Clock pulse duration, low 1 ns Zero crossing, 10-pF parasitic loading to GND on each tDRY CLK to DRY delay(2) 1000 1400 1800 ps output pin Zero crossing, 10-pF parasitic loading to GND on each tDATA CLK to DATA/OVR delay(2) 800 1400 2000 ps output pin tDATA – tDRY, 10-pF parasitic loading to GND on each output tSKEW DATA to DRY skew –500 0 500 ps pin tRISE DRY/DATA/OVR rise time 10-pF parasitic loading to GND on each output pin 500 ps tFALL DRY/DATA/OVR fall time 10-pF parasitic loading to GND on each output pin 500 ps (1) Timing parameters are ensured by design or characterization, but not production tested. (2) DRY, DATA, and OVR are updated on the falling edge of CLK. The latency must be added to tDATA to determine the overall propagation delay. 10 Submit Documentation Feedback Copyright © 2007–2016, Texas Instruments Incorporated Product Folder Links: ADS5474 |
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