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ISO1640BDR Datasheet(PDF) 32 Page - Texas Instruments |
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ISO1640BDR Datasheet(HTML) 32 Page - Texas Instruments |
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32 / 46 page ![]() 1 ISO164 0 SDA2 SCL2 SCL1 GND2 GND1 VCC2 VCC1 SDA1 4 Side 1 Side 2 2 mm maximu m 2 mm maximu m 8 7 6 5 2 3 1 3.3 k 3.3 k 0.01 …F 0.01 …F 0.01 …F 0.01 …F 3.3 k 3.3 k 3.3 k 3.3 k 3.3 k 3.3 k Figure 9-5. Typical ISO1640 Circuit Hookup 1 ISO164 1 SDA2 SCL2 SCL1 GND2 GND1 VCC2 VCC1 SDA1 4 Side 1 Side 2 2 mm maximu m 2 mm maximu m 8 7 6 5 2 3 1 3.3 k 3.3 k 0.01 …F 0.01 …F 0.01 …F 0.01 …F 3.3 k 3.3 k 3.3 k 3.3 k 3.3 k 3.3 k Figure 9-6. Typical ISO1641 Circuit Hookup 9.2.3 Application Curve VOL1 = 650 mV GND Figure 9-7. Side 1: Low-to-High Transition 9.3 Insulation Lifetime Insulation lifetime projection data is collected by using the industry-standard Time Dependent Dielectric Breakdown (TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a ISO1640, ISO1641, ISO1644 SLLSFC2C – MAY 2021 – REVISED JUNE 2021 www.ti.com 32 Submit Document Feedback Copyright © 2021 Texas Instruments Incorporated Product Folder Links: ISO1640 ISO1641 ISO1644 |
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