LTC5594

6

Rev A

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combined performance of demodulator and amplifier unless otherwise noted. (Notes 2, 3, 6, 9, 21, 24)

SYMBOL

PARAMETER

CONDITIONS

MIN

TYP

MAX

UNITS

Serial Interface Pins

High Level Input Voltage

CSB, SDI, SCK

V

Low Level Input Voltage

CSB, SDI, SCK

V

Input Hysteresis Voltage

CSB, SDI, SCK

250

mV

Input Current

CSB, SDI, SCK (Note 19)

10

μA

High Level Output Voltage

SDO, 10mA Current Sink

V

Low Level Output Voltage

SDO, 10mA Current Source

V

Serial Interface Timing

SCK High Time

25

ns

SCK Low Time

25

ns

CSB Setup Time

10

ns

CSB High Time

10

ns

SDI to SCK Setup Time

6

ns

SDI to SCK Hold Time

6

ns

SCK to SDO Time

16

ns

Note 1: Stresses beyond those listed under Absolute Maximum Ratings may

cause permanent damage to the device. Exposure to any Absolute Maximum

Rating condition for extended periods may affect device reliability and

–0.3V, otherwise damage to the ESD diodes may occur.

Note 2: Tests are performed with the test circuit of Figure 1.

Note 3: The LTC5594 is guaranteed to be functional over the –40°C to

105°C case temperature operating range.

Note 4: DSB noise figure is measured at the baseband frequency of 15MHz

with a small-signal noise source without any filtering on the RF input and

no other RF signal applied.

Note 5: A 6.8pF shunt capacitor is used on the RF inputs for 300MHz to

500MHz. 0.2pF is used for 500MHz to 9GHz.

Note 6: The differential amplifier outputs (IFIP, IFIM and IFQP, IFQM) are

combined using a 180° combiner.

RF and LO input signals are appropriately filtered, as well as the baseband

output.

Note 8: Power conversion gain is defined from the RF input to the I or Q

output. Power conversion gain is measured with a 100Ω differential load

impedance on the I and Q outputs. Any losses due to IF combiner and

spectrum analyzer termination have been de-embedded.

the measured gain error and phase error.

Note 12: This is the recommended operating range, operation outside the

listed range is possible with degraded performance to some parameters.

Note 13: DC offset measured differentially between IFIP and IFIM and

between IFQP and IFQM. The reported value is the mean of the absolute

values of the characterization data distribution.

Note 14: IF amplitude is within 10% of final value.

Note 15: IF amplitude is at least 30dB down from its on state.

Note 16: IF outputs shorted to ground.

Note 17: IF tone spacing set at 1MHz.

Note 18: Worst case isolation measured to each IF single-ended port.

Note 19: Guaranteed by design characterization, not tested in production.

otherwise damage to the ESD diodes may occur.

Note 21: Refer to Appendix for register definition and default values.

Note 22: Mixer outputs directly connected to amplifier inputs. Bandwidth

measured on single amplifier output, I or Q.