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VR5510 Datasheet(PDF) 12 Page - NXP Semiconductors

Part # VR5510
Description  Multi-output PMIC with SMPS and LDO
PDF  203 Pages
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Manufacturer  NXP [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo NXP - NXP Semiconductors

VR5510 Datasheet(HTML) 12 Page - NXP Semiconductors

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NXP Semiconductors
VR5510
Multi-output PMIC with SMPS and LDO
• VSUP minimum voltage depends on the external components (LPI_DCR) and the application conditions
(IPRE, F_VPRESW).
When VPRE is switching at 455 kHz, the VR5510 maximum continuous operating voltage is 36 V. The part is
validated at 48 V for a limited duration of 15 minutes at room temperature to satisfy the jump-start requirement
of 24 V applications. It can sustain a 58 V load dump without external protection.
When VPRE is switching at 2.2 MHz, the VR5510 maximum continuous operating voltage is 18 V. The part is
validated at 26 V for limited duration of 2 minutes at room temperature to satisfy the jump-start requirement of
12 V applications and a 35 V load dump.
8.4 Thermal ratings
Symbol
Parameter
Conditions
Min
Max
Unit
RθJA
Thermal Resistance Junction to Ambient
[1]
2s2p circuit board [2]
—
27
°C/W
RθJA
Thermal Resistance Junction to Ambient
[1]
2s8p circuit board [2]
—
17
°C/W
RθJB
Junction to Board Thermal Resistance
2s2p circuit board [2]
—
22
°C/W
RθJB
Junction to Board Thermal Resistance
2s8p circuit board [2]
—
15
°C/W
RθJC_BOTTOM
Junction to Case Bottom Thermal
Resistance
2s8p and 2s2p circuit
board [2]
—
1.5
°C/W
RθJC_TOP
Junction to Case Top Thermal Resistance 2s8p and 2s2p circuit
board [2]
—
17
°C/W
ΨJT_TOP
Thermal Resistance Parameter Junction to
top [1]
Between the package
top and the junction
temperature [1]
—
1
°C/W
TA
Ambient Temperature (Automotive)
-40
125
°C
TA
Ambient Temperature (Industrial)
-40
105
°C
TJ
Junction Temperature
-40
150
°C
TSTG
Storage Temperature
-55
150
°C
Table 5. Thermal ratings
[1]
Determined in accordance with JEDEC JESD51-2A natural convection environment. Thermal resistance data in this report is solely for a thermal
performance comparison of one package to another in a standardized specified environment. It is not meant to predict the performance of a package in an
application-specific environment. Uniform power is assumed on die top surface.
[2]
Thermal test board meets JEDEC specification for this package (JESD51-9)
8.5 EMC compliancy
Pin
Pin_Type
EMC Compliance
VBAT (VSUP1/2) Global
HV_HVLDO_IN
Global
PWRON1
Global
Conducted Emissions – IEC 61967-4 (150 Ω method, 12-M level, 50% load on regulators)
Conducted Immunity – IEC 62132-4 (36dBm, Class A, No state change on FS0B, RSTB,
PGOOD, INTB, 50% load on all regulators and accuracy in spec
FS0B
Global
Conducted Emissions – IEC 61967-4 (150 Ω method, 12-M level, 50% load on regulators)
Conducted Immunity – IEC 62132-4 (30dBm, Class A, No state change on FS0B, RSTB,
PGOOD, INTB, 50% load on all regulators and accuracy in spec
Table 6. VR5510 EMC compliancy chart
VR5510
All information provided in this document is subject to legal disclaimers.
© 2023 NXP B.V. All rights reserved.
Product data sheet
Rev. 6 — 31 July 2023
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