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56F8014 Datasheet(PDF) 97 Page - Freescale Semiconductor, Inc |
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56F8014 Datasheet(HTML) 97 Page - Freescale Semiconductor, Inc |
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97 / 125 page ![]() Flash Memory Characteristics 56F8014 Technical Data, Rev. 9 Freescale Semiconductor 97 Preliminary Figure 10-2 Input Signal Measurement References Figure 10-3 shows the definitions of the following signal states: • Active state, when a bus or signal is driven, and enters a low impedance state • Tri-stated, when a bus or signal is placed in a high impedance state • Data Valid state, when a signal level has reached VOL or VOH • Data Invalid state, when a signal level is in transition between VOL and VOH Figure 10-3 Signal States 10.4 Flash Memory Characteristics Table 10-9 Flash Timing Parameters Characteristic Symbol Min Typ Max Unit Program time1 1. There is additional overhead which is part of the programming sequence. See the 56F801X Peripheral Reference Manual for details. Tprog 20 — 40 μs Erase time2 2. Specifies page erase time. There are 512 bytes per page in the Program Flash memory. Terase 20 — — ms Mass erase time Tme 100 — — ms VIH VIL Fall Time Input Signal Note: The midpoint is VIL + (VIH – VIL)/2. Midpoint1 Low High 90% 50% 10% Rise Time Data Invalid State Data1 Data2 Valid Data Tri-stated Data3 Valid Data2 Data3 Data1 Valid Data Active Data Active |
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