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AD9239 Datasheet(PDF) 34 Page - Analog Devices

Part # AD9239
Description  Quad, 12-Bit, 170 MSPS/210 MSPS/250 MSPS Serial Output 1.8 V ADC
PDF  40 Pages
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Manufacturer  AD [Analog Devices]
Direct Link  http://www.analog.com
Logo AD - Analog Devices

AD9239 Datasheet(HTML) 34 Page - Analog Devices

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AD9239
Rev. 0 | Page 34 of
40
Table 14. Memory Map Register
Addr.
(Hex)
Register
Name
(MSB)
Bit 7
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
(LSB)
Bit 0
Default
Value
(Hex)
Default
Notes/
Comments
Chip Configuration Registers
00
chip_port_
config (local,
master)
SDO active
(not
required,
ignored if
not used)
LSB
first
Soft
reset
16 bit
address
(default
mode for
ADCs)
0x18
01
chip_id
(global)
8-bit Chip ID Bits[2:0]
0x0B – AD9239 – 12-bit quad
Read
only
02
chip_grade
(global)
Speed grade
010 = 170
100 = 210
101 = 250
Read
only
Device Index and Transfer Registers
05
device_
index_A
(global)
ADC A
ADC B
ADC C
ADC D
0x0F
Bits are set
to determine
which device
on chip
receives the
next write
command.
The default
is all devices
on chip.
FF
device_
update (local,
master)
SW
transfer
1 = on
0 = off
(default)
0x00
Synchro-
nously
transfers
data from
the master
shift register
to the slave.
ADC Functions Registers
08
modes
(local)
External
PDWN
pin
function
00 = full
PDWN
(default)
01 =
standby
00 = chip run
(default)
01 = full power-down
10 = standby
11 = reset
0x00
Determines
various ge-
neric modes
of chip
operation.
09
Clock
(global)
Duty
cycle
stabilize
1 = on
(default)
0 = off
0x01
Turns the
internal
duty cycle
stabilizer
on and off.
0D
test_io
(local)
Reset PN
long gen
1 = on
0 = off
(default)
Reset PN
short gen
1 = on
0 = off
(default)
Flex output test mode
0000 = off (normal operation)
0001 = midscale short
0010 = +FS short
0011 = −FS short
0100 = checkerboard output
0101 = PN 23 sequence
0110 = PN 9 sequence
0111 = one/zero word toggle
0x00
When set,
the test data
is placed on
the output
pins in place
of normal
data.
0E
test_bist
(local)
BIST init
1 = on
0 = off
(default)
BIST
enable
1 = on
0 = off
(default)
0x00
When Bit 0
is set, the
built-in self-
test function
is initiated.



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