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ADS1246 Datasheet(PDF) 2 Page - Texas Instruments

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Part # ADS1246
Description  24-Bit Analog-to-Digital Converters for Temperature Sensors
PDF  66 Pages
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Manufacturer  TI [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI - Texas Instruments

ADS1246 Datasheet(HTML) 2 Page - Texas Instruments

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ADS1246
ADS1247
ADS1248
SBAS426D – AUGUST 2008 – REVISED MARCH 2010
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
PACKAGE/ORDERING INFORMATION(1)
DUAL SENSOR
EXCITATION CURRENT
PACKAGE-
PRODUCT
NUMBER OF INPUTS
VOLTAGE REFERENCE
SOURCES
LEAD
1 Differential
ADS1246
or
External
NO
TSSOP-16
1 Single-Ended
2 Differential
ADS1247
or
Internal or External
YES
TSSOP-20
3 Single-Ended
4 Differential
ADS1248
or
Internal or External
YES
TSSOP-28
7 Single-Ended
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this data sheet, or see the TI
website at www.ti.com
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range (unless otherwise noted).
ADS1246, ADS1247, ADS1248
PARAMETER
MIN
MAX
UNIT
AVDD to AVSS
–0.3
+5.5
V
AVSS to DGND
–2.8
+0.3
V
DVDD to DGND
–0.3
+5.5
V
100, momentary
mA
Input current
10, continuous
mA
Analog input voltage to AVSS
AVSS – 0.3
AVDD + 0.3
V
Digital input voltage to DGND
–0.3
DVDD + 0.3
V
Maximum junction temperature
+150
°C
Operating temperature range
–40
+125
°C
Storage temperature range
–60
+150
°C
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2
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Copyright © 2008–2010, Texas Instruments Incorporated
Product Folder Link(s): ADS1246 ADS1247 ADS1248



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