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TLE5012 Datasheet(PDF) 52 Page - Infineon Technologies AG |
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TLE5012 Datasheet(HTML) 52 Page - Infineon Technologies AG |
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52 / 57 page ![]() TLE5012 Specification Target Data Sheet 52 V 0.46, 2009-09 3.6 Test Structure 3.6.1 ADC Test Vectors It is possible to feed the ADCs with appropriate values to simulate a certain magnet position and other GMR effects. This test can be activated within SIL register (ADCTV_EN). With ADCTV_Y and ADCTV_X the vector length can be adjusted like Figure 26. The values are generated with resistors on the chip. The following X/Y ADC values can be programmed: • 4 points, circle amplitude = 70% (0°,90°, 180°, 270°) • 8 points, circle amplitude = 100% (0°, 45°, 90°, 135°, 180°, 225°, 270°, 315°) • 8 points, circle amplitude = 122.1% (35.3°, 54.7°, 125.3°, 144.7°, 215.3°, 234.7°, 305.3°, 324.7°) • 4 points, circle amplitude = 141.4% (45°, 135°, 225°, 315°) Figure 26 ADC Test Vectors Index t0° - 5 - µs 0° t90° - 10 - µs 90° t180° - 15 - µs 180° t270° - 20 - µs 270° Table 18 Incremental Interface (cont’d) Parameter Symbol Values Unit Note / Test Condition Min. Typ. Max. ADCTV_X ADCTV_Y 0% 122.1% 100.0% 70% 141.4% |
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