ADRF6801 datasheet(30/36 Pages) AD

30 / 36 page

ADRF6801

Rev. 0 | Page 30 of 36

CHARACTERIZATION SETUPS

Figure 48 to Figure 50 show the general characterization bench

setups used extensively for the ADRF6801. The setup shown in

Figure 48 was used to do the bulk of the testing. An automated

Agilent VEE program was used to control the equipment over the

IEEE bus. This setup was used to measure gain, input P1dB, output

P1dB, input IP2, input IP3, IQ gain mismatch, IQ quadrature

accuracy, and supply current. The evaluation board was used to

perform the characterization with a Mini-Circuits TCM9-1+ balun

on each of the I and Q outputs. When using the TCM9-1+ balun

below 5 MHz (the specified 1 dB low frequency corner of the

balun), distortion performance degrades; however, this is not

the ADRF6801 degrading, merely the low frequency corner of

the balun introducing distortion effects. Through this balun,

the 9-to-1 impedance transformation effectively presented a 450 Ω

differential load at each of the I and Q channels. The losses of the

output baluns were de-embedded from all measurements.

To do phase noise and reference spur measurements, the setup

shown in Figure 50 was used. Phase noise was measured at the

baseband output (I or Q) at a baseband carrier frequency of

50 MHz. The baseband carrier of 50 MHz was chosen to allow

phase noise measurements to be taken at frequencies of up to

20 MHz offset from the carrier. The noise figure was measured

using the setup shown in Figure 49 at a baseband frequency

of 10 MHz.

ADRF6801 Datasheet(PDF) 30 Page - Analog Devices