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SWRA370 Datasheet(PDF) 20 Page - Texas Instruments

Part # SWRA370
Description  Basic RF Testing of CCxxxx Devices
PDF  34 Pages
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Manufacturer  TI1 [Texas Instruments]
Direct Link  http://www.ti.com
Logo TI1 - Texas Instruments

SWRA370 Datasheet(HTML) 20 Page - Texas Instruments

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PC with SmartRF Studio
installed
SmartRF Eval Board
and Eval Module
SmartRF Eval Board
and Eval Module
TX
RX
Shielded Box
Variable
Attenuator
1
2
Sum
Combiner
(1)
RF Generator
RF Out
Ext 1 In
Receive Testing Without LabVIEW
www.ti.com
6.3
Interference Testing with RF Generator
Purpose: To verify that the receiver sensitivity conforms to the published standards.
Pass Condition: See respective standards document for specifications and pass conditions.
Test Environment: Figure 13 illustrates the test setup for interference testing with an RF generator.
(1)
3-dB loss in signal on each input path through the combiner.
Figure 13. Interference Testing with RF Generator Setup
Procedure:
Step 1.
Connect the instruments and test board as shown in Figure 13.
Step 2.
The TX and RX boards must be set up as for the sensitivity test.
Step 3.
The interference signal is set up by using a continuous, unmodulated signal where the
frequency can be different from TX and RX unless testing for co-channel interference.
Step 4.
Set the output power of the TX such that the received power at the RX end is 10 dB above
the sensitivity threshold obtained from sensitivity testing. (Remove 10 dB of attenuation from
the attenuators after completing the sensitivity test.)
Step 5.
Set the output power low for the interference signal initially, and perform the sensitivity test at
the RX.
Step 6.
Continue to increase the output power of the interference signal until the PER is greater than
1%. The difference between the TX and INT power measured at the RX side indicates the
ability of the CCxxxx device to overcome interference.
20
Basic RF Testing of CCxxxx Devices
SWRA370
– August 2011
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Copyright
© 2011, Texas Instruments Incorporated



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